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Versatile Magnetic Probe Station Wafer Level Manual Probe Stations For Magnetic Testing

Manual In Plane Probe Station For Wafer Level Magnetic Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications. Equipped with PID closed-loop feedback regulation, the magnetic field
Product Details
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Versatile Magnetic Probe Station

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Wafer Level Manual Probe Stations

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Manual Probe Stations Versatile

Name: Magnetic Probe Station
Magnetic Field Uniformity: Better Than ±1%φ1 Mm
Testing Functions: RH Testing
Sample Size: Compatible With 8-inch And Below
Magnetic Field Strength: 50 MT
Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT
Optical Magnification: 0.75 X-5 X
Probe Seat: 4 Groups Of DC Probes

Basic Properties

Brand Name: Truth Instruments
Model Number: PS1D-Manu8

Trading Properties

Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
Product Description

Manual In Plane Probe Station For Wafer Level Magnetic Testing

Product Description:

The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications.

Equipped with PID closed-loop feedback regulation, the magnetic field resolution of this probe station is an impressive 0.05 MT, ensuring high precision and consistency in test results. The PID closed-loop feedback regulation system enables automatic adjustments to maintain the desired magnetic field strength, enhancing the reliability of the testing process.

One of the key features of this probe station is its RH testing capability, allowing users to perform comprehensive testing and analysis of materials under varying environmental conditions. The RH testing function provides valuable insights into the behavior of materials in different humidity levels, enabling researchers to make informed decisions and optimize their processes.

For convenient and flexible testing setups, the probe station is equipped with 4 groups of DC probes, allowing users to easily connect and position their samples for testing. The manual positioning feature enables precise alignment of samples, ensuring accurate measurements and reliable data collection.

Compatible with 8-inch and below sample sizes, this probe station offers versatility and adaptability to accommodate a wide range of sample types and sizes. Whether testing small-scale samples or larger wafers, users can rely on this probe station to deliver consistent and accurate results.

In addition to its advanced testing capabilities, the Wafer-Level Manual In-Plane Magnetic Field Probe Station also offers manual control options, giving users full control over the testing process. The manual control feature allows for fine adjustments and customization of testing parameters, empowering researchers to tailor their experiments to their specific needs.

Overall, the Wafer-Level Manual In-Plane Magnetic Field Probe Station is a sophisticated tool that combines precision, reliability, and flexibility for magnetoresistance testing applications. With its high magnetic field strength, exceptional resolution, RH testing function, probe seat configuration, and compatibility with various sample sizes, this probe station is an invaluable asset for researchers looking to conduct thorough and accurate magnetic field testing.

 

Features:

  • Product Name: Wafer-Level Manual In-Plane Magnetic Field Probe Station
  • Optical Magnification: 0.75 X-5 X
  • Probe Seat: 4 Groups Of DC Probes
  • Magnetic Field Strength: 50 MT
  • Testing Functions: RH Testing
  • Magnetic Field Uniformity: Better Than ±1%φ1 Mm
 

Technical Parameters:

Magnetic Field Strength 50 MT
Sample Size Compatible With 8-inch And Below
Probe Seat 4 Groups Of DC Probes
Magnetic Field Resolution PID Closed-loop Feedback Regulation, Resolution 0.05 MT
Optical Magnification 0.75 X-5 X
Testing Functions RH Testing
Magnetic Field Uniformity Better Than ±1%φ1 Mm
 

Applications:

Truth Instruments' Wafer-Level Manual In-Plane Magnetic Field Probe Station, model PS1D-Manu8, is designed and manufactured in CHINA to provide precise and efficient magnetoresistance testing for a variety of applications.

With exceptional magnetic field uniformity better than ±1%φ1 mm, this manual probe station is ideal for research and development environments where accurate measurements are essential. The probe station is compatible with sample sizes of 8-inch and below, offering versatility for different testing requirements.

Equipped with optical magnification ranging from 0.75X to 5X, the PS1D-Manu8 allows for detailed observation and analysis of samples under test. The magnetic field strength of 50 MT enables reliable and consistent testing results, ensuring the quality and integrity of the data collected.

The probe seat of this manual probe station features 4 groups of DC probes, providing flexibility and control during testing procedures. Whether conducting material analysis, device characterization, or other magnetic field-related experiments, this probe station offers a reliable platform for accurate measurements.

Product Application Occasions and Scenarios:

  • Research laboratories conducting magnetoresistance testing
  • Material science facilities analyzing magnetic properties
  • Device manufacturing companies ensuring product quality
  • Educational institutions teaching magnetic field concepts

Overall, Truth Instruments' Wafer-Level Manual In-Plane Magnetic Field Probe Station, model PS1D-Manu8, is a versatile and reliable tool for a wide range of magnetoresistance testing applications. Its precision, compatibility, and performance make it a valuable asset for researchers, engineers, and educators seeking to explore the characteristics of magnetic fields in various materials and devices.

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