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Kerr mikroskobu

Kalite Magneto Optik Kerr Mikroskopu Kapsamlı Malzeme Karakterizasyonu için 250Nm Dönüş Deneme Mikroskopu fabrika

Magneto Optik Kerr Mikroskopu Kapsamlı Malzeme Karakterizasyonu için 250Nm Dönüş Deneme Mikroskopu

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE microscope offers a wide range of capabilities to support precise measurements and analysis of magnetic properties. With objectives ranging from 5x to 100x, including non-magnetic

Magneto Optik Kerr Mikroskopu Kapsamlı Malzeme Karakterizasyonu için 250Nm Dönüş Deneme Mikroskopu

Kalite Hysteresis Loop Ölçüm Aracı MOKE Manyetik Ölçüm Aracı Minyatür fabrika

Hysteresis Loop Ölçüm Aracı MOKE Manyetik Ölçüm Aracı Minyatür

Miniature Hysteresis Loop Measurement Instrument Product Introduction The MINIMOKE miniature MOKE magnetic measurement instrument uses the magneto-optical Kerr effect to measure hysteresis loops, offering advantages such as speed, precision, non-contact, and non-destructive (no additional sample processing required). It provides information on coercive force, saturation magnetic field, and remanence of magnetic materials. Lightweight, compact, easy to operate, and fast

Hysteresis Loop Ölçüm Aracı MOKE Manyetik Ölçüm Aracı Minyatür

Kalite Wafer seviyesi histerez döngüsü enstrümanı yıkıcı olmayan wafer ölçüm sistemi fabrika

Wafer seviyesi histerez döngüsü enstrümanı yıkıcı olmayan wafer ölçüm sistemi

Wafer-Level Hysteresis Loop Measurement Instrument Product Introduction Using polar/longitudinal magneto-optical Kerr effects (MOKE), this instrument rapidly and globally detects the magnetism of wafer films. Non-contact measurement avoids wafer damage and is suitable for post-patterning sample testing in spin chip production. It provides a vertical magnetic field of up to 2.5 T and an in-plane magnetic field of up to 1.4 T, with strong magnetic fields inducing free and

Wafer seviyesi histerez döngüsü enstrümanı yıkıcı olmayan wafer ölçüm sistemi

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