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Kerr Microscope

Quality Magneto Optic Kerr Microscope 250Nm Spin Test Microscope For Comprehensive Material Characterization factory

Magneto Optic Kerr Microscope 250Nm Spin Test Microscope For Comprehensive Material Characterization

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE microscope offers a wide range of capabilities to support precise measurements and analysis of magnetic properties. With objectives ranging from 5x to 100x, including non-magnetic

Magneto Optic Kerr Microscope 250Nm Spin Test Microscope For Comprehensive Material Characterization

Quality Hysteresis Loop Measurement Instrument MOKE Magnetic Measurement Instrument Miniature factory

Hysteresis Loop Measurement Instrument MOKE Magnetic Measurement Instrument Miniature

Miniature Hysteresis Loop Measurement Instrument Product Introduction The MINIMOKE miniature MOKE magnetic measurement instrument uses the magneto-optical Kerr effect to measure hysteresis loops, offering advantages such as speed, precision, non-contact, and non-destructive (no additional sample processing required). It provides information on coercive force, saturation magnetic field, and remanence of magnetic materials. Lightweight, compact, easy to operate, and fast

Hysteresis Loop Measurement Instrument MOKE Magnetic Measurement Instrument Miniature

Quality Wafer Level Hysteresis Loop Instrument Non Destructive Wafer Measurement System factory

Wafer Level Hysteresis Loop Instrument Non Destructive Wafer Measurement System

Wafer-Level Hysteresis Loop Measurement Instrument Product Introduction Using polar/longitudinal magneto-optical Kerr effects (MOKE), this instrument rapidly and globally detects the magnetism of wafer films. Non-contact measurement avoids wafer damage and is suitable for post-patterning sample testing in spin chip production. It provides a vertical magnetic field of up to 2.5 T and an in-plane magnetic field of up to 1.4 T, with strong magnetic fields inducing free and

Wafer Level Hysteresis Loop Instrument Non Destructive Wafer Measurement System

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