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Mikroskop Kerr

Kualitas Mikroskop Kerr Magneto Optik 250Nm Mikroskop Uji Spin Untuk Karakterisasi Material Komprehensif pabrik

Mikroskop Kerr Magneto Optik 250Nm Mikroskop Uji Spin Untuk Karakterisasi Material Komprehensif

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE microscope offers a wide range of capabilities to support precise measurements and analysis of magnetic properties. With objectives ranging from 5x to 100x, including non-magnetic

Mikroskop Kerr Magneto Optik 250Nm Mikroskop Uji Spin Untuk Karakterisasi Material Komprehensif

Kualitas Instrumen Pengukuran Hysteresis Loop MOKE Instrumen Pengukuran Magnetik Miniatur pabrik

Instrumen Pengukuran Hysteresis Loop MOKE Instrumen Pengukuran Magnetik Miniatur

Miniature Hysteresis Loop Measurement Instrument Product Introduction The MINIMOKE miniature MOKE magnetic measurement instrument uses the magneto-optical Kerr effect to measure hysteresis loops, offering advantages such as speed, precision, non-contact, and non-destructive (no additional sample processing required). It provides information on coercive force, saturation magnetic field, and remanence of magnetic materials. Lightweight, compact, easy to operate, and fast

Instrumen Pengukuran Hysteresis Loop MOKE Instrumen Pengukuran Magnetik Miniatur

Kualitas Wafer Level Hysteresis Loop Instrument Non-Destructive Wafer Measurement System (Sistem Pengukuran Wafer Tidak merusak) pabrik

Wafer Level Hysteresis Loop Instrument Non-Destructive Wafer Measurement System (Sistem Pengukuran Wafer Tidak merusak)

Wafer-Level Hysteresis Loop Measurement Instrument Product Introduction Using polar/longitudinal magneto-optical Kerr effects (MOKE), this instrument rapidly and globally detects the magnetism of wafer films. Non-contact measurement avoids wafer damage and is suitable for post-patterning sample testing in spin chip production. It provides a vertical magnetic field of up to 2.5 T and an in-plane magnetic field of up to 1.4 T, with strong magnetic fields inducing free and

Wafer Level Hysteresis Loop Instrument Non-Destructive Wafer Measurement System (Sistem Pengukuran Wafer Tidak merusak)

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