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Kerr -Mikroskop

Qualität Magnetoptisches Kerr-Mikroskop 250 Nm Spin-Testmikroskop zur umfassenden Materialcharakterisierung Fabrik

Magnetoptisches Kerr-Mikroskop 250 Nm Spin-Testmikroskop zur umfassenden Materialcharakterisierung

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE microscope offers a wide range of capabilities to support precise measurements and analysis of magnetic properties. With objectives ranging from 5x to 100x, including non-magnetic

Magnetoptisches Kerr-Mikroskop 250 Nm Spin-Testmikroskop zur umfassenden Materialcharakterisierung

Qualität Hystereseschleifen-Messgerät MOKE Magnetmessgerät Miniatur Fabrik

Hystereseschleifen-Messgerät MOKE Magnetmessgerät Miniatur

Miniature Hysteresis Loop Measurement Instrument Product Introduction The MINIMOKE miniature MOKE magnetic measurement instrument uses the magneto-optical Kerr effect to measure hysteresis loops, offering advantages such as speed, precision, non-contact, and non-destructive (no additional sample processing required). It provides information on coercive force, saturation magnetic field, and remanence of magnetic materials. Lightweight, compact, easy to operate, and fast

Hystereseschleifen-Messgerät MOKE Magnetmessgerät Miniatur

Qualität Wafer-Level-Hystereseschleifen-Messgerät für zerstörungsfreie Wafer-Messung Fabrik

Wafer-Level-Hystereseschleifen-Messgerät für zerstörungsfreie Wafer-Messung

Wafer-Level Hysteresis Loop Measurement Instrument Product Introduction Using polar/longitudinal magneto-optical Kerr effects (MOKE), this instrument rapidly and globally detects the magnetism of wafer films. Non-contact measurement avoids wafer damage and is suitable for post-patterning sample testing in spin chip production. It provides a vertical magnetic field of up to 2.5 T and an in-plane magnetic field of up to 1.4 T, with strong magnetic fields inducing free and

Wafer-Level-Hystereseschleifen-Messgerät für zerstörungsfreie Wafer-Messung

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