原子力顕微鏡

カスタマイズ可能なAFMシステム 科学産業材料顕微鏡 強力なスケーラビリティ
Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key
カスタマイズ可能なAFMシステム 科学産業材料顕微鏡 強力なスケーラビリティ

オールインワン原子間力顕微鏡 多機能生物顕微鏡 柔軟で精密な操作用
All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the
オールインワン原子間力顕微鏡 多機能生物顕微鏡 柔軟で精密な操作用

ナノスケール 潜在的な原子力顕微鏡 調整可能な工業顕微鏡 高解像度
Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers
ナノスケール 潜在的な原子力顕微鏡 調整可能な工業顕微鏡 高解像度
カー顕微鏡

MOKE・ウェーファースキャナー (EFEM) ヒステレシスと磁気均一性マップのためのウェーファー測定システム
MOKE Wafer Scanner For Hysteresis And Magnetic Uniformity Maps Product Description: Introducing the Wafer-Level Hysteresis Loop Measurement Instrument, a cutting-edge tool in Spintronics Metrology designed to meet the demanding requirements of advanced research and development in the field. This innovative product offers unparalleled capabilities for precise and efficient measurement of magnetic properties at the wafer level. One of the key features of this state-of-the-art
MOKE・ウェーファースキャナー (EFEM) ヒステレシスと磁気均一性マップのためのウェーファー測定システム

スピンテスト マグネト光学ケール顕微鏡 多機能研究顕微鏡 材料分析用
Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which
スピンテスト マグネト光学ケール顕微鏡 多機能研究顕微鏡 材料分析用

高温MOKE顕微鏡 450Nm 研究顕微鏡 強い磁場磁化プロセス研究
High Temperature MOKE for Strong Field Magnetization Process Study Product Description: The Permanent Magnet Kerr Microscope is an advanced tool designed for studying magnetic materials with precision and accuracy. This cutting-edge microscope utilizes Permanent Magnet Materials to generate in-plane magnetic fields, providing researchers with valuable insights into the magnetic properties of their samples. One of the key features of this microscope is its water-cooled magnet,
高温MOKE顕微鏡 450Nm 研究顕微鏡 強い磁場磁化プロセス研究
振動サンプル磁力計

低ノイズ振動サンプル磁気計 高速VSM 多用性 信頼性の高い磁気特性
High Speed VSM For Fast And Reliable Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a powerful tool designed to meet the needs of researchers working with materials such as Multiferroics and Spintronics. This advanced instrument offers precise measurements and reliable performance, making it an essential asset for any laboratory focusing on magnetic materials. One of the key features of the VSM is its low noise level, which is
低ノイズ振動サンプル磁気計 高速VSM 多用性 信頼性の高い磁気特性

精密制御振動磁気計 77 K - 950 K 温度範囲 VSM 粉末フィルム用
Vibrating Sample Magnetometer For Powders Films And Bulk Samples Product Description: A Vibrating Sample Magnetometer (VSM) is an essential tool for researchers and scientists working in the field of magnetic materials and properties. This particular VSM product offers a comprehensive set of features and capabilities that make it a top choice for those in need of a reliable and precise magnetic property measurement system. One of the key highlights of this VSM is its
精密制御振動磁気計 77 K - 950 K 温度範囲 VSM 粉末フィルム用

汎用的で敏感な振動サンプル磁気計 低騒音磁気特性測定システム
High Sensitivity VSM Accurate Vibrating Sample Magnetometer Systems Product Description: Introducing the Vibrating Sample Magnetometer, a cutting-edge device designed for precise and efficient magnetic measurements. This advanced instrument is equipped with a range of features that make it an essential tool for researchers and scientists seeking accurate data on magnetic properties. The sample holder of the Vibrating Sample Magnetometer offers a remarkable ±360-degree
汎用的で敏感な振動サンプル磁気計 低騒音磁気特性測定システム
マグニートー光クライオスタット

高磁場光学クライオスタット 超伝導磁石クライオスタット 低温磁気光学用
High Field Optical Cryostat For Low Temperature Magneto Optics Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge product designed for precise and reliable optical property measurements in a wide temperature range. This advanced cryostat features multiple electrical channels, exceptional temperature stability, and high-quality optical windows, making it ideal for a variety of research
高磁場光学クライオスタット 超伝導磁石クライオスタット 低温磁気光学用

インテグレテッド マグネト オプティカル クリオスタット マグネト 低温 クリオスタット 光譜学と量子材料
Magneto Optical Cryostat With Magnet For Spectroscopy And Quantum Materials Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat, also known as MO-Cryostat, offers a wide temperature range, with the ability to operate within temperatures ranging from 1.7 K to 350 K. This extensive temperature range allows for versatile experimental conditions and precise measurements across various temperature regimes. Equipped
インテグレテッド マグネト オプティカル クリオスタット マグネト 低温 クリオスタット 光譜学と量子材料

超伝導磁石クライオスタット 科学低温クライオスタット 自由空間光学アクセス付き
Superconducting Magnet Cryostat With Free Space Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed to meet the demanding requirements of low-temperature experiments in various scientific fields. This innovative cryostat offers a wide temperature range from 1.7 K to 350 K, making it suitable for a diverse range of experiments that require precise temperature control. One of the key features of the Magneto Optical Cryostat
超伝導磁石クライオスタット 科学低温クライオスタット 自由空間光学アクセス付き
極低温プローブステーション

4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション
Cryogen Free Probe Station For Automated 4K Device Measurements Product Description: The Cryogenic Probe Station is a cutting-edge device designed for cryogen-free, cost-effective, and precise cryogenic device characterization. With its advanced features and capabilities, this probe station offers unparalleled performance for research and testing applications. One of the key highlights of the Cryogenic Probe Station is its probe arm configuration. The standard configuration
4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション

ハールとSOT試験のための汎用的な冷凍探査ステーション超伝導磁気探査ステーション
Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe arms, this probe station can support up to 8 probe arms, providing flexibility and scalability for various testing needs. Featuring X-Y-Z probe arm stroke dimensions of 50 mm, 25
ハールとSOT試験のための汎用的な冷凍探査ステーション超伝導磁気探査ステーション

4本アーム自動プローブステーション 精密磁気プローブステーション 3T超伝導マグネット付き
Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station offers exceptional temperature stability with a range from 10 K to 420 K, maintaining a remarkably low temperature variation of less than ±20 MK. Equipped with a vertical superconducti
4本アーム自動プローブステーション 精密磁気プローブステーション 3T超伝導マグネット付き
MRAMテスター

自動MRAMテスター 磁気チップ最終テスト機 生産およびバッチ最終テスト用
Automated MRAM Tester For Production And Batch Final Testing Product Description: The Magnetic Chip Final Test Machine is an advanced Automated Tri-temp MRAM Tester designed to provide precise and reliable testing for magnetic chips. Equipped with cutting-edge features, this machine ensures accurate results and efficient performance. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe. This feature guarantees the machine's
自動MRAMテスター 磁気チップ最終テスト機 生産およびバッチ最終テスト用

磁気チップ製造ライン向けプロフェッショナル自動試験装置 多用途最終試験機
Automated Final Test System for Magnetic Chip Production Lines Product Description: The Magnetic Chip Final Test Machine is a cutting-edge product designed for precise and efficient testing of magnetic chips. With its advanced features and capabilities, this machine is the perfect solution for conducting thorough and accurate testing processes. One of the key features of this test machine is the Test Ambient Temperature Module. Equipped with a temperature monitoring module,
磁気チップ製造ライン向けプロフェッショナル自動試験装置 多用途最終試験機

多用途MRAMテスター 高分解能ATEテスト装置 電気チップ特性用
ATE For Non Destructive Magnetic And Electrical Chip Properties Product Description: One of the key highlights of this product is its Excitation System2, which ensures the uniformity of the X-axis magnetic field with an impressive accuracy of ≤±1% at 2000 Oe within a Φ35 mm spherical space. This level of precision guarantees consistent and reliable test results, particularly when analyzing in-plane magnetic fields. Moreover, the Excitation System4 of the machine boasts a
多用途MRAMテスター 高分解能ATEテスト装置 電気チップ特性用
磁気プローブステーション

高精度RF探査ステーション 50 MT マグネトレジスタンスのためのマニュアル・ウェーファー探査機
Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key
高精度RF探査ステーション 50 MT マグネトレジスタンスのためのマニュアル・ウェーファー探査機

汎用磁気探査ステーション ワッファーレベル マニュアル探査ステーション 磁気試験
Manual In Plane Probe Station For Wafer Level Magnetic Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications. Equipped with PID closed-loop feedback regulation, the magnetic field
汎用磁気探査ステーション ワッファーレベル マニュアル探査ステーション 磁気試験

アップグレード可能な2Dプローブステーション 磁場プローブステーション 精密研究および生産用
Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed examination of 2D vector fields, making it an ideal tool for researchers and professionals working in fields such as second harmonic testing and spintronics. Key Features: Air Gap