English
Français
Deutsch
Italiano
Русский
Español
Português
Nederlandse
Ελληνικά
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
原子力顕微鏡
多機能原子力顕微鏡 低騒音物質顕微鏡 MFM EFM PFMモード
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of
多機能原子力顕微鏡 低騒音物質顕微鏡 MFM EFM PFMモード
0.1Hz - 30Hz 原子力顕微鏡 ナノスケールスキャン探査機顕微鏡
Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows
0.1Hz - 30Hz 原子力顕微鏡 ナノスケールスキャン探査機顕微鏡
力変調走査型原子間力顕微鏡 高分解能科学顕微鏡 0.04 nm
Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient
力変調走査型原子間力顕微鏡 高分解能科学顕微鏡 0.04 nm
カー顕微鏡
低温高場レーザー・ケル顕微鏡 マイクロ領域画像顕微鏡
Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for
低温高場レーザー・ケル顕微鏡 マイクロ領域画像顕微鏡
ラピッドMOKEヒステレシスループトレーサー 1 Mdeg 研究室と産業用
Rapid MOKE Hysteresis Loop Tracer For Lab And Industrial Use Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge Desktop MOKE System designed for precise quality inspection in various industries. With a Kerr Angle Resolution of 1 Mdeg (RMS) and a Magnetic Field Resolution of 0.05 MT, this instrument offers high precision measurements for accurate analysis. Operating on a 10.4-inch All-in-one Touch Control with WIN7 System, this
ラピッドMOKEヒステレシスループトレーサー 1 Mdeg 研究室と産業用
精密ケール顕微鏡 クリオMOKEシステム スピントロニック材料の磁性成像
Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle
精密ケール顕微鏡 クリオMOKEシステム スピントロニック材料の磁性成像
マグニートー光クライオスタット
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
極低温プローブステーション
4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション
Cryogen Free Probe Station For Automated 4K Device Measurements Product Description: The Cryogenic Probe Station is a cutting-edge device designed for cryogen-free, cost-effective, and precise cryogenic device characterization. With its advanced features and capabilities, this probe station offers unparalleled performance for research and testing applications. One of the key highlights of the Cryogenic Probe Station is its probe arm configuration. The standard configuration
4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション
自動磁気測定のための精密冷凍探査ステーション
Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature
自動磁気測定のための精密冷凍探査ステーション
MRAMテスター
三温磁気チップテスター 高信頼性検証用精密最終テスター
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
三温磁気チップテスター 高信頼性検証用精密最終テスター
磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
