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원자력 현미경

품질 다기능 원자력 현미경 저소음 재료 현미경 (MFM, EFM, PFM 모드) 공장

다기능 원자력 현미경 저소음 재료 현미경 (MFM, EFM, PFM 모드)

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of

다기능 원자력 현미경 저소음 재료 현미경 (MFM, EFM, PFM 모드)

품질 0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경 공장

0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경

품질 힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm 공장

힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm

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커 현미경

품질 저온 고장 레이저 케어 현미경 마이크로 영역 이미지 현미경 공장

저온 고장 레이저 케어 현미경 마이크로 영역 이미지 현미경

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for

저온 고장 레이저 케어 현미경 마이크로 영역 이미지 현미경

품질 실험실 및 산업용 1 Mdeg 급속 MOKE 히스테리시스 루프 추적기 공장

실험실 및 산업용 1 Mdeg 급속 MOKE 히스테리시스 루프 추적기

Rapid MOKE Hysteresis Loop Tracer For Lab And Industrial Use Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge Desktop MOKE System designed for precise quality inspection in various industries. With a Kerr Angle Resolution of 1 Mdeg (RMS) and a Magnetic Field Resolution of 0.05 MT, this instrument offers high precision measurements for accurate analysis. Operating on a 10.4-inch All-in-one Touch Control with WIN7 System, this

실험실 및 산업용 1 Mdeg 급속 MOKE 히스테리시스 루프 추적기

품질 정밀 커 현미경 극저온 MOKE 시스템, 스핀트로닉 재료 자화 영상화 공장

정밀 커 현미경 극저온 MOKE 시스템, 스핀트로닉 재료 자화 영상화

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle

정밀 커 현미경 극저온 MOKE 시스템, 스핀트로닉 재료 자화 영상화

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