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Atomaire krachtmicroscoop

Kwaliteit Multi Functionele Atomic Kracht Microscoop Low Noise Materialen Microscoop Met MFM EFM PFM Modi fabriek

Multi Functionele Atomic Kracht Microscoop Low Noise Materialen Microscoop Met MFM EFM PFM Modi

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of

Multi Functionele Atomic Kracht Microscoop Low Noise Materialen Microscoop Met MFM EFM PFM Modi

Kwaliteit 0.1Hz - 30Hz Atomic Force Microscopie Nanoscopische Scanning Probe Microscopen fabriek

0.1Hz - 30Hz Atomic Force Microscopie Nanoscopische Scanning Probe Microscopen

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

0.1Hz - 30Hz Atomic Force Microscopie Nanoscopische Scanning Probe Microscopen

Kwaliteit Krachtmodulatiescanning Atoommicroscoop Hoogoplossende wetenschappelijke microscoop 0,04 Nm fabriek

Krachtmodulatiescanning Atoommicroscoop Hoogoplossende wetenschappelijke microscoop 0,04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

Krachtmodulatiescanning Atoommicroscoop Hoogoplossende wetenschappelijke microscoop 0,04 Nm

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Kerr -microscoop

Kwaliteit Laag Temperatuur Hoog Veld Laser Kerr Microscopie Micro Regio Imaging Microscopie fabriek

Laag Temperatuur Hoog Veld Laser Kerr Microscopie Micro Regio Imaging Microscopie

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for

Laag Temperatuur Hoog Veld Laser Kerr Microscopie Micro Regio Imaging Microscopie

Kwaliteit Snelle MOKE Hysteresis Loop Tracer 1 mdeg voor Laboratorium en Industrieel Gebruik fabriek

Snelle MOKE Hysteresis Loop Tracer 1 mdeg voor Laboratorium en Industrieel Gebruik

Rapid MOKE Hysteresis Loop Tracer For Lab And Industrial Use Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge Desktop MOKE System designed for precise quality inspection in various industries. With a Kerr Angle Resolution of 1 Mdeg (RMS) and a Magnetic Field Resolution of 0.05 MT, this instrument offers high precision measurements for accurate analysis. Operating on a 10.4-inch All-in-one Touch Control with WIN7 System, this

Snelle MOKE Hysteresis Loop Tracer 1 mdeg voor Laboratorium en Industrieel Gebruik

Kwaliteit Precisie Kerr Microscoop Cryo MOKE Systeem Voor Magnetisatie Imaging Van Spintronische Materialen fabriek

Precisie Kerr Microscoop Cryo MOKE Systeem Voor Magnetisatie Imaging Van Spintronische Materialen

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle

Precisie Kerr Microscoop Cryo MOKE Systeem Voor Magnetisatie Imaging Van Spintronische Materialen

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