Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this

Kerr Microscope For High Resolution Permanent Magnet Characterization Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced magneto-optical microscopy applications, offering exceptional optical resolution of 450 Nm. This microscope is equipped with both in-plane and vertical strong magnetic field capabilities, allowing for precise control and manipulation of magnetic domains. The in-plane magnetic field is generated by a water

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and

Permanent Magnet Kerr Microscope Product Introduction Designed for in-depth research on permanent magnet materials, this advanced precision testing instrument enables high-resolution precise measurement and detailed observation of longitudinal, transverse, and vertical magneto-optical Kerr effects under stringent testing conditions of strong magnetic fields, ambient temperature, and high temperature. To ensure sample stability during testing under strong magnetic forces, it

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a