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GM Refrigerated Cryogenic Probe Station with 4K-420K Temperature Range, Ultra-Low Electrical Leakage Current, and Multi-Probe (4-8 Arms) for Advanced Research

GM Refrigerated Probe: 4K-420K, 4-8 Arms & I-V/C-V/Optoelectronic Research Advanced Cryogenic Probe Station The Cryogenic Probe Station is a state-of-the-art 0-67GHz microwave-compatible 4K cryogenic probe station designed for advanced research and development in low-temperature physics, semiconductor testing, and microwave device characterization. This integrated system offers exceptional precision and versatility for ultra-low temperature environments ranging from 4 K to
Product Details
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4K-420K Temperature Range Cryogenic Probe Station

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Ultra-Low Electrical Leakage Current Low Temperature Probe Station

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Multi-Probe (4-8 Arms) 4K Cryogenic Probe Station

Vibration: Sample Stage Vibration <1 μm (peak-to-peak)
Thermal Anchor: Probe Holder And Sample Stage Temperature Difference <10 K
Number Of Probe Arms: Standard 4 Probe Arms, Up To 8 Supported
Needing Range: Needing Range
Electrical Leakage Current: <100fA@1V
Optical Microscope: 0.75 ×-3.75 × Continuous Zoom
Sample Temperature: 4 K-420 K
Sample Holder Type: Ground, Coaxial, Triaxial Options

Basic Properties

Brand Name: Truth Instruments
Model Number: PS-Cryo
Product Description
GM Refrigerated Probe: 4K-420K, 4-8 Arms & I-V/C-V/Optoelectronic Research
Advanced Cryogenic Probe Station
The Cryogenic Probe Station is a state-of-the-art 0-67GHz microwave-compatible 4K cryogenic probe station designed for advanced research and development in low-temperature physics, semiconductor testing, and microwave device characterization. This integrated system offers exceptional precision and versatility for ultra-low temperature environments ranging from 4 K to 420 K.
Featuring remarkable temperature stability of ±1.20 mK across the entire operating range, this probe station ensures consistent and reliable measurements during extended testing periods.
Key Features
  • Product Name: PS-Cryo 4K cryogenic probe station
  • Electrical Leakage Current: <100fA@1V for ultra-low noise measurements
  • Probe Arm Stroke: Precise X-Y-Z movement with 50 mm, 25 mm, and 25 mm travel respectively
  • Sample Holder Type: Versatile options including Ground, Coaxial, and Triaxial holders
  • Number of Probe Arms: Standard 4 probe arms with support for up to 8 arms
  • Sample Temperature Range: 4 K to 420 K for various cryogenic applications
  • Multi-probe (4-8 arms) cryogenic optoelectronic/microwave capabilities
  • Low-vibration high-vacuum design ensuring stable measurements
Technical Specifications
Electrical Leakage Current <100fA@1V
Temperature Stability ±<1.20 mK (4 K-420 K)
Frequency Range 0-50 MHz With Low-temperature Coaxial Cable, 0.1 GHz With Semi-rigid Coaxial Cable
Thermal Anchor Probe Holder And Sample Stage Temperature Difference <10 K
Microwave Probe 0-40 GHz With K-type Connector, 0-67 GHz With 1.85 mm Connector
Vibration Sample Stage Vibration <1 μm (peak-to-peak)
Sample Anchor Sample Holder Diameter Up To 51 mm
Sample Temperature 4 K-420 K
Optical Microscope 0.75×-3.75× Continuous Zoom
Sample Holder Type Ground, Coaxial, Triaxial Options
Applications
The PS-Cryo cryogenic probe station is engineered for advanced research requiring precise low-temperature measurements. This one-click controlled integrated system is ideal for cutting-edge semiconductor testing, quantum computing research, and superconducting device characterization.
The GM refrigeration closed-loop cryogenic testing system ensures reliable continuous cooling while maintaining a low-temperature vacuum environment of less than 1.2E-3Pa, essential for minimizing thermal noise and preserving sample integrity during sensitive measurements.
Serving academic institutions, national laboratories, and semiconductor manufacturing facilities, this versatile system supports next-generation transistor development, 2D materials research, and spintronics applications with exceptional performance and reliability.
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