Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers

Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostat

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art instrument designed to provide unparalleled precision and versatility in surface property mapping at the nanoscale. Engineered to meet the demanding requirements of advanced research and industrial applications, this AFM offers a comprehensive suite of features that make it an indispensable tool for scientists and engineers working with semiconductors, magnetic materials, and a variety of other

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its