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4 K Cryogenic Tester with ±1.20 mK Stability and 0-67 GHz Microwave for 2-Inch Samples in a Low-Temperature Probe Station
PS-Cryo 4 K Cryogenic Probe Station The PS-Cryo 4 K cryogenic probe station is a state-of-the-art solution designed for precise electrical testing of samples at ultra-low temperatures ranging from 4 K to 420 K. This cost-effective system meets demanding requirements for researchers and engineers ...
Product Details
Highlight:
±1.20mK Stability Cryogenic Probe Station
,0-67GHz Microwave 4 K Cryogenic Tester
,2-Inch Samples Low-Temperature Probe Station
DC Probe:
ZN50, Tip Material Tungsten Or Beryllium Copper
Vibration:
Sample Stage Vibration <1 μm (peak-to-peak)
Needing Range:
Needing Range
Number Of Probe Arms:
Standard 4 Probe Arms, Up To 8 Supported
Sample Anchor:
Sample Holder Diameter Up To 51 Mm
Microwave Probe:
0-40 GHz With K-type Connector, 0-67 GHz With 1.85 Mm Connecto
Thermal Anchor:
Probe Holder And Sample Stage Temperature Difference <10 K
Probe Arm Stroke:
X-Y-Z, 50 Mm-25 Mm-25 Mm
Basic Properties
Brand Name:
Truth Instruments
Model Number:
PS-Cryo
Product Description
PS-Cryo 4 K Cryogenic Probe Station
The PS-Cryo 4 K cryogenic probe station is a state-of-the-art solution designed for precise electrical testing of samples at ultra-low temperatures ranging from 4 K to 420 K. This cost-effective system meets demanding requirements for researchers and engineers working with advanced materials and semiconductor devices at cryogenic temperatures.
Key Features
- Low-vibration high-vacuum cryogenic probe station ensuring stable and precise measurements
- Thermal anchor with probe holder and sample stage temperature difference less than 10 K
- Frequency range: 0-50 MHz with low-temperature coaxial cable, 0.1 GHz with semi-rigid coaxial cable
- Microwave probe support: 0-40 GHz with K-type connector, 0-67 GHz with 1.85 mm connector
- Sample holder types available: Ground, Coaxial, and Triaxial options
- Probe arm stroke dimensions: X-Y-Z axes with 50mm, 25mm, and 25mm travel respectively
- Optimized for advanced cryogenic testing applications requiring minimal environmental interference
Technical Specifications
| Parameter | Specification |
|---|---|
| Vibration | Sample Stage Vibration <1 μm (peak-to-peak) |
| Vacuum | Low-temperature Vacuum <1.2E-3Pa |
| Thermal Anchor | Probe Holder and Sample Stage Temperature Difference <10 K |
| Electrical Leakage Current | <100 fA@1 V |
| Sample Temperature | 4 K-420 K |
| Microwave Probe | 0-40 GHz with K-type connector, 0-67 GHz with 1.85 mm connector |
| Optical Microscope | 0.75×-3.75× Continuous Zoom |
| Temperature Stability | ±<1.20 mK (4 K-420 K) |
| Sample Anchor | Sample Holder Diameter Up To 51 mm |
| Probe Arm Stroke | X-Y-Z, 50 mm-25 mm-25 mm |
Applications
The PS-Cryo Cryogenic Probe Station is designed for precision measurements and analysis under extreme temperature conditions. It is ideal for research and development applications in fields such as semiconductor device characterization, quantum computing, and superconductivity studies.
Typical applications include low-temperature electrical testing, semiconductor device research, low-temperature physics experiments, quantum device testing, superconducting circuit characterization, and advanced microwave component analysis. The system's GM refrigeration closed-loop cryogenic testing system provides reliable continuous cooling without liquid cryogens, making it cost-effective and environmentally friendly.
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