AtomExplorer: Customizable AFM For Advanced Magnetic & Electrical Measures

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to deliver precise nanoscale topography imaging for a wide range of research and industrial applications. Engineered with advanced technology, this AFM model offers exceptional imaging capabilities that allow users to explore surface structures at the nanometer scale with remarkable clarity and accuracy. Its robust design supports customizable AFM solutions to meet the diverse needs of scientists, engineers, and material researchers.

One of the standout features of the Basic-type AFM is its flexible image sampling points, ranging from 32*32 up to an impressive 4096*4096. This extensive range allows users to adjust the resolution and field of view according to their specific requirements, enabling detailed analysis of nanoscale surface features. Whether conducting quick surveys or in-depth examinations, the AFM provides optimal imaging performance without compromising speed or accuracy.

The scanning method employed by this AFM is a sophisticated XYZ three-axis full-sample scanning technique. This approach ensures comprehensive coverage of the sample surface by precisely controlling the movement in all three spatial dimensions. The full-sample scanning capability facilitates thorough surface mapping, capturing every nuance of the nanoscale topography. This makes the Basic-type AFM an ideal choice for applications requiring meticulous surface characterization.

Operating modes are crucial in tailoring the AFM’s functionality to different sample types and experimental goals. The Basic-type AFM supports multiple operating modes, including Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode. Tap Mode is particularly useful for soft or delicate samples, minimizing damage while maintaining high-resolution imaging. Contact Mode offers direct interaction with the sample surface for robust measurements, while Lift Mode allows for non-contact scanning to analyze surface forces without interference. Phase Imaging Mode provides additional contrast based on material properties, enhancing the ability to distinguish between different surface components.

Beyond topography imaging, the Basic-type AFM is equipped with multifunctional measurement capabilities, significantly expanding its utility. It integrates advanced techniques such as Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These functionalities allow researchers to investigate electrical, piezoelectric, and magnetic properties at the nanoscale, facilitating comprehensive material characterization. This multifunctional versatility makes the Basic-type AFM an indispensable tool for multidisciplinary research and development.

Another critical performance parameter is the Z-axis noise level, which directly impacts the sensitivity and precision of vertical measurements. The Basic-type AFM boasts an impressively low Z-axis noise level of 0.04 nm, ensuring that minute variations in surface height are accurately detected. This low noise threshold enhances the reliability of nanoscale topography imaging and quantitative surface analysis, enabling users to trust the data generated by the microscope.

In summary, the Basic-type Atomic Force Microscope offers a powerful combination of high-resolution nanoscale topography imaging, advanced scanning techniques, and versatile operating modes. Its customizable AFM solutions cater to a broad spectrum of scientific inquiries, providing reliable and detailed insights into surface morphology and material properties. Whether for academic research, industrial quality control, or innovative material development, this AFM model is designed to deliver exceptional performance and adaptability.

By integrating precise image sampling, comprehensive scanning methods, multifunctional measurement modes, and ultra-low noise levels, the Basic-type AFM stands out as a premier instrument for nanoscale surface characterization. Its ability to provide detailed nanoscale topography imaging and multifunctional analysis makes it a vital tool for pushing the boundaries of nanotechnology and materials science.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Image Sampling Points: 32*32 to 4096*4096
• Sample Size: Φ 25 Mm
• Scanning Method: XYZ Three-Axis Full-Sample Scanning
• Z-Axis Noise Level: 0.04 Nm
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, Phase Imaging Mode
• Supports Surface Texture Analysis for detailed material characterization
• Capable of Electrostatic Force Microscopy (EFM) for electrical property mapping
• Includes Kelvin Probe Force Microscopy functionality for surface potential measurement

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer is a versatile Basic-type Atomic Force Microscope (AFM) designed for a wide range of application occasions and scenarios. Originating from China, this advanced microscope offers exceptional performance for professionals engaged in nano structure analysis and nanoscale topography imaging. With its precise Z-Axis noise level of just 0.04 Nm and innovative Tip Protection Technology featuring Safe Needle Insertion Mode, the AtomExplorer ensures reliable and damage-free operation during sensitive measurements.

In industrial research and development environments, the AtomExplorer serves as a powerful industrial R&D microscope, enabling scientists and engineers to explore materials at the nanoscale with confidence. Its comprehensive scanning range options of 100 μm * 100 μm * 10 μm and 30 μm * 30 μm * 5 μm accommodate diverse sample sizes and resolutions, making it ideal for applications ranging from semiconductor inspection to advanced materials science.

The microscope supports multiple operating modes, including Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, providing flexibility to tailor imaging techniques to specific sample characteristics. Furthermore, the multifunctional measurement capabilities of the AtomExplorer enhance its utility by integrating Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These advanced modes allow for comprehensive surface property analysis beyond mere topography, such as electrical, piezoelectric, and magnetic behaviors at the nanoscale.

Typical application occasions for the AtomExplorer include academic research labs focusing on nanotechnology, industrial quality control for nanoscale component manufacturing, and material science investigations requiring detailed surface characterization. It is equally suited for pharmaceutical research to analyze drug delivery systems and for energy sector studies involving novel nanomaterials. The price of this state-of-the-art AFM is negotiable, and potential users are encouraged to contact Truth Instruments for a detailed quote tailored to their specific needs.

In summary, the Truth Instruments AtomExplorer Basic-type Atomic Force Microscope is an indispensable tool for any setting demanding high-precision nano structure analysis and nanoscale topography imaging. Its robust features, flexible operation modes, and multifunctional measurement capabilities make it an excellent choice for industrial R&D and beyond.