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Highly Integrated Cryogenic Probe Station 4 K - 420 K Low Temperature Probe Station
Cryogenic Probe Station Product Introduction The PS-Cryo closed-loop 4 K cryogenic probe station uses a GM refrigeration mechanism, requiring no consumable liquid helium, providing a low-temperature environment down to 4 K. It can accommodate 2-inch samples and meets standard I-V, C-V, microwave, and optoelectronic testing needs. Highly integrated and systematized, software operation allows one-click temperature control and electrical testing, making it the most cost
Product Details
Highlight:
Highly Integrated Cryogenic Probe Station
,Cryogenic Probe Station 4 K
,420 K Low Temperature Probe Station
Name:
Cryogenic Probe Station
Sample Temperature:
4 K-420 K
Thermal Anchor:
Probe Arms And Sample Stage Temperature Difference <10 K
Vibration:
Sample Stage Vibration <1 μm (peak-to-peak)
Sample Space:
Sample Holder Diameter Up To 51 Mm
Probe Arm Stroke:
X-Y-Z, 50 Mm-25 Mm-25 Mm
Temperature Stability:
<±20 MK (4 K-420 K)
Needing Range:
Any Point Within 25 Mm Diameter
Number Of Probe Arms:
Standard 4 Probe Arms, Up To 8 Supported
Basic Properties
Place of Origin:
CHINA
Brand Name:
Truth Instruments
Model Number:
PS-Cryo
Trading Properties
Price:
Price Negotiable | Contact us for a detailed quote
Payment Terms:
T/T
Product Description
Cryogenic Probe Station
Product Introduction
The PS-Cryo closed-loop 4 K cryogenic probe station uses a GM refrigeration mechanism, requiring no consumable liquid helium, providing a low-temperature environment down to 4 K. It can accommodate 2-inch samples and meets standard I-V, C-V, microwave, and optoelectronic testing needs. Highly integrated and systematized, software operation allows one-click temperature control and electrical testing, making it the most cost-effective choice for cryogenic electrical testing.
Equipment Performance
| Equipment Performance Indicator | Description |
|---|---|
| Sample Temperature | 4 K-420 K |
| Temperature Stability | <±20 mK (4 K-420 K) |
| Vibration | Sample stage vibration <1 μm (peak-to-peak) |
| Vacuum | Low-temperature vacuum <1.2E-3Pa |
| Probe Arm Stroke | X-Y-Z, 50 mm-25 mm-25 mm |
| Needing Range | Any point within 25 mm diameter |
| Number of Probe Arms | Standard 4 probe arms, up to 8 supported |
| Thermal Anchor | Probe arms and sample stage temperature difference <10 K |
| Sample Space | Sample holder diameter up to 51 mm |
| Sample Holder Type | Ground, coaxial, triaxial options |
| DC Probe | ZN50, tip material tungsten or beryllium copper |
| Frequency Range | 0-50 MHz with low-temperature coaxial cable, 0-1 GHz with semi-rigid coaxial cable |
| Microwave Probe | GSG, tip material tungsten |
| Frequency Range | 0-40 GHz with K-type connector, 0-67 GHz with 1.85 mm connector |
| Electrical Leakage Current | <100 fA@1 V |
| Optical Microscope | 0.75 X-3.75 X continuous zoom |
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