Versatile AFM Solutions For Education & Industrial Research

Product Description:

The Basic-type Atomic Force Microscope (AFM) is an advanced piece of Laboratory AFM equipment designed to meet the rigorous demands of scientific research. This AFM Microscope combines precision, versatility, and reliability, making it an ideal choice for researchers who require detailed surface analysis at the nanoscale. With its superior performance and multifunctional capabilities, the Basic-type AFM is tailored to provide comprehensive insights into material properties across a wide range of applications.

One of the standout features of this AFM for scientific research is its exceptional Z-Axis Noise Level of just 0.04 nm. This ultra-low noise level ensures highly accurate surface topography measurements, enabling researchers to capture even the most subtle variations in sample surfaces. The precision of the Z-axis control significantly enhances the quality of imaging and data reliability, which is crucial for advanced nanotechnology studies and material characterization.

The Basic-type AFM offers flexible scanning ranges to accommodate diverse sample sizes and research requirements. It provides two scanning range options: 100 μm * 100 μm * 10 μm and 30 μm * 30 μm * 5 μm, allowing users to choose the optimal scale for their specific experiment. This adaptability makes it suitable for a wide variety of samples, from large-scale surface features to minute nanoscale structures, thereby increasing its applicability in multiple scientific disciplines.

Safety and sample integrity are paramount in any microscopy technique, and this AFM Microscope excels in this area with its innovative Tip Protection Technology. The Safe Needle Insertion Mode safeguards the cantilever tip during sample approach and scanning, reducing the risk of tip damage and prolonging its lifespan. This technology enhances operational efficiency by minimizing downtime and maintenance costs, which is particularly advantageous in busy research laboratories.

Beyond standard atomic force microscopy, the Basic-type AFM supports a broad range of multifunctional measurements, making it a versatile tool for comprehensive surface analysis. It integrates Electrostatic Force Microscopy (EFM) for probing electrical properties, Scanning Kelvin Probe Force Microscopy (KPFM) for measuring surface potential, Piezoelectric Force Microscopy (PFM) for studying piezoelectric materials, and Magnetic Force Microscopy (MFM) for magnetic domain imaging. These capabilities enable researchers to perform complex, multi-parameter investigations without the need for multiple instruments.

The image sampling points of the Basic-type AFM range from 32 * 32 to an impressive 4096 * 4096, offering exceptional resolution and detail in captured images. This wide range of sampling options allows scientists to balance between imaging speed and resolution according to their experimental needs. High-resolution imaging is essential for detailed surface morphology studies, while lower resolution settings can be used for rapid scanning of larger areas.

In summary, the Basic-type Atomic Force Microscope is a powerful and reliable Laboratory AFM equipment designed for cutting-edge scientific research. Its ultra-low Z-axis noise level, versatile scanning ranges, innovative tip protection, multifunctional measurement modes, and high-resolution imaging capabilities collectively make it an indispensable tool for nanoscience and material science laboratories. Whether you are investigating electrical properties, magnetic domains, piezoelectric effects, or simply mapping surface topography, this AFM Microscope provides the precision and flexibility needed to advance your research.

Features:

• Product Name: Basic-type Atomic Force Microscope
• High stability AFM for reliable and precise measurements
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM)
• Tip Protection Technology with Safe Needle Insertion Mode to prevent damage
• Low Z-Axis Noise Level of 0.04 Nm ensuring accurate nanoscale topography imaging
• XYZ Three-Axis Full-Sample Scanning method for comprehensive surface analysis
• Supports sample sizes up to Φ 25 Mm
• Ideal Laboratory AFM equipment for advanced research and development

Technical Parameters:

Applications:

The Basic Atomic Force Microscope, model AtomExplorer, by Truth Instruments, is an advanced yet user-friendly tool designed for a wide range of scientific and industrial applications. Originating from CHINA, this Atomic Force Microscope is ideal for researchers, engineers, and quality control professionals who require precise surface characterization at the nanoscale. With a versatile scanning range of 100 μm*100 μm*10 μm and 30 μm*30 μm*5 μm, it accommodates various sample sizes up to Φ 25 mm, making it suitable for studying diverse materials including semiconductors, polymers, biological specimens, and nanostructures.

One of the standout features of the AtomExplorer Basic Atomic Force Microscope is its Tip Protection Technology, specifically the Safe Needle Insertion Mode. This technology ensures the longevity and reliability of the AFM tip during sample approach and scanning, reducing the risk of damage and enabling stable measurements over extended periods. This makes it an excellent choice for delicate samples or environments where precision and sample integrity are paramount.

The multifunctional measurement capabilities of this Atomic Force Microscope extend its usability beyond standard topography imaging. With integrated Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM), users can perform comprehensive surface potential, piezoelectric, and magnetic property analyses. This multifunctionality positions the AtomExplorer as a versatile instrument for materials science, nanotechnology research, and electronic device development.

Its flexible image sampling points, ranging from 32*32 up to 4096*4096, allow users to tailor resolution and scan speed according to specific research needs, delivering detailed images with high accuracy. The Basic Atomic Force Microscope’s ease of use, combined with its advanced features, makes it suitable for academic laboratories, industrial R&D centers, and quality assurance departments seeking reliable nanoscale surface characterization.

As the price is negotiable, prospective buyers are encouraged to contact Truth Instruments for a detailed quote tailored to their specific requirements. Whether for fundamental research, product development, or educational purposes, the AtomExplorer Atomic Force Microscope offers a compelling solution that balances performance, affordability, and versatility.