พบ
36
ผลิตภัณฑ์สำหรับ "afm systems
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AFM ที่มีความมั่นคงสูงที่มีโหมด MFM/EFM สําหรับการวิจัยวิทยาศาสตร์
Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ... -
การจำแนกพื้นผิวระดับนาโนสเกลด้วย AtomExplorer AFM
Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization... -
AtomExplorer AFM: MFM, EFM และ KFM ที่บูรณาการสําหรับการวิเคราะห์วัสดุ
Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ... -
รูปแบบ MFM/KPFM สําหรับการระบุลักษณะวัสดุขนาดนาโนความละเอียดสูง
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ... -
AtomExplorer: ไมโครสโกปสแกนซอนด์ความแม่นยําสูง (SPM/AFM)
Product Description: The Basic-type Atomic Force Microscope is a cutting-edge nanoscale microscope designed to provide high-precision imaging and multifunctional measurement capabilities for a wide range of scientific and industrial applications. This advanced instrument employs an XYZ three-axis ... -
กล้องจุลทรรศน์แรงอะตอมแบบมัลติฟังก์ชัน
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ... -
แกน Z สัญญาณรบกวนต่ำสำหรับการจำแนกวัสดุระดับนาโนที่แม่นยำสูง
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ... -
กล้องจุลทรรศน์แรงอะตอมขนาด 0.04 นาโนเมตร สำหรับการวิเคราะห์พื้นผิวระดับนาโนที่แม่นยำ
Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed ... -
แกน Z สัญญาณรบกวนต่ำสำหรับการจำแนกวัสดุระดับนาโนที่แม่นยำสูง
Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...