English
Français
Deutsch
Italiano
Русский
Português
Nederlandse
Ελληνικά
日本語
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
Encontró
36
productos para "afm systems
"-
AFM de alta estabilidad con modos MFM/EFM para investigación científica
Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ... -
Caracterización de la superficie a nanoescala con AtomExplorer AFM
Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization... -
AtomExplorer AFM: MFM, EFM y KFM integrados para el análisis de materiales
Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ... -
Modos MFM/KPFM para la caracterización de materiales a nanoescala de alta precisión
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ... -
AtomExplorer: Microscopio de sonda de barrido (SPM/AFM) de alta precisión
Product Description: The Basic-type Atomic Force Microscope is a cutting-edge nanoscale microscope designed to provide high-precision imaging and multifunctional measurement capabilities for a wide range of scientific and industrial applications. This advanced instrument employs an XYZ three-axis ... -
Microscopio de fuerza atómica multifunción
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ... -
Eje Z de bajo ruido para la caracterización de materiales a nanoescala de alta precisión
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ... -
Microscopio de fuerza atómica de 0.04 nm para análisis preciso de superficies a nanoescala
Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed ... -
Eje Z de bajo ruido para la caracterización de materiales a nanoescala de alta precisión
Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...
