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원자력 현미경
00.04nm 원자력 현미경 0.1Hz - 30Hz AFM 현미경 정밀 나노 스케일 표면 분석
Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force
00.04nm 원자력 현미경 0.1Hz - 30Hz AFM 현미경 정밀 나노 스케일 표면 분석
0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경
Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows
0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경
힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm
Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient
힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm
커 현미경
하이 필드 웨이퍼 측정 시스템 MOKE 웨이퍼 스캐너 MRAM 및 자기 필름 특성화
High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non
하이 필드 웨이퍼 측정 시스템 MOKE 웨이퍼 스캐너 MRAM 및 자기 필름 특성화
웨이퍼 레벨 MOKE 시스템 0.3 Mdeg, 빠른 히스테리시스 루프 및 공정 제어용
Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,
웨이퍼 레벨 MOKE 시스템 0.3 Mdeg, 빠른 히스테리시스 루프 및 공정 제어용
저온 고자장 Kerr 현미경 레이저 MOKE 현미경, 미세 영역 이미징용
Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In
저온 고자장 Kerr 현미경 레이저 MOKE 현미경, 미세 영역 이미징용
진동 샘플 자력계
신속하고 신뢰할 수 있는 자기 측정을 위한 터너키 VSM 시스템 고정도 진동 자기계
Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and
신속하고 신뢰할 수 있는 자기 측정을 위한 터너키 VSM 시스템 고정도 진동 자기계
고정밀 진동 시료 자력계 고자장 옵션용 저잡음 VSM 시스템
Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its
고정밀 진동 시료 자력계 고자장 옵션용 저잡음 VSM 시스템
고정밀 진동 자력계 고감도 VSM 자력계
High-Precision Vibrating Sample Magnetometer Product Introduction The TIM-70 high-precision vibrating sample magnetometer, independently developed by Zhizhen Precision, measures magnetization curves, hysteresis loops, demagnetization curves, heating curves, cooling curves, and other magnetic parameters such as saturation magnetization, remanent magnetization, coercive force, maximum energy product, Curie temperature, superconducting transition temperature, Néel temperature,
고정밀 진동 자력계 고감도 VSM 자력계
마그네토 광학 극저온 장치
정밀 마그네토 광학 크리오스타트 융합 마그네트 크리오스타트 유연한 크리오 측정
Integrated Magneto Optical Cryostat For Flexible Cryo Measurements Product Description: The Magneto Optical Cryostat is a cutting-edge device designed for advanced research in the field of magneto optical measurements. With its exceptional features and superior performance, this cryostat offers researchers a powerful tool to conduct experiments in high magnetic fields with precision and accuracy. One of the standout attributes of this cryostat is its optical windows
정밀 마그네토 광학 크리오스타트 융합 마그네트 크리오스타트 유연한 크리오 측정
1.7 K - 350 K 자석 광적 냉정기 초전도 MO 냉정기
Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate
1.7 K - 350 K 자석 광적 냉정기 초전도 MO 냉정기
극저온 프로브 스테이션
고정밀 극저온 프로브 스테이션, 스핀트로닉스 2D 재료 및 초전도체용 극저온 프로브 스테이션
Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the
고정밀 극저온 프로브 스테이션, 스핀트로닉스 2D 재료 및 초전도체용 극저온 프로브 스테이션
수직 자기장 극저온 프로브 스테이션, 냉매 불필요 저온 프로브 스테이션
Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field
수직 자기장 극저온 프로브 스테이션, 냉매 불필요 저온 프로브 스테이션
정밀 크로이오겐 프로브 스테이션 자동 자기 측정용 크로이오겐 무료 프로브 스테이션
Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature
정밀 크로이오겐 프로브 스테이션 자동 자기 측정용 크로이오겐 무료 프로브 스테이션
MRAM 테스터
MRAM 및 스핀트로닉스 Chip 테스터 Tri Temp Ate Automated Batch Testing을위한 자동 테스트 장비
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic
MRAM 및 스핀트로닉스 Chip 테스터 Tri Temp Ate Automated Batch Testing을위한 자동 테스트 장비
자동 MRAM 테스터 자기 칩 최종 테스트 머신 고속
Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different
자동 MRAM 테스터 자기 칩 최종 테스트 머신 고속
자기 프로브 스테이션
평면 및 수직 자기 프로브 스테이션 140 MT 웨이퍼 프로버, 첨단 테스트용
In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength
평면 및 수직 자기 프로브 스테이션 140 MT 웨이퍼 프로버, 첨단 테스트용
140 MT 웨이퍼 프로브 스테이션 2D 프로빙 스테이션 (스핀트로닉스 및 웨이퍼 레벨 테스트용)
2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different
140 MT 웨이퍼 프로브 스테이션 2D 프로빙 스테이션 (스핀트로닉스 및 웨이퍼 레벨 테스트용)
2차원 장치 특성화를 위한 벡터 자기 탐사 역 확장 가능한 웨이퍼 탐사 역
Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this
