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원자력 현미경
고 스캔 힘 현미경 0.15 Nm 고 해상도 현미경
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
고 스캔 힘 현미경 0.15 Nm 고 해상도 현미경
모든 것 하나에 원자력 현미경 다기능 생물학 현미경 유연한 정밀 작동
All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the
모든 것 하나에 원자력 현미경 다기능 생물학 현미경 유연한 정밀 작동
맞춤형 AFM 시스템 과학 산업 재료 현미경, 강력한 확장성
Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key
맞춤형 AFM 시스템 과학 산업 재료 현미경, 강력한 확장성
커 현미경
250Nm 케어 현미경 고해상도 마그네토 광학 케어 효과 현미경
Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and
250Nm 케어 현미경 고해상도 마그네토 광학 케어 효과 현미경
첨단 케어 현미경 마이크로마그네틱스 및 영역 영상 촬영을 위한 고해상도 현미경
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
첨단 케어 현미경 마이크로마그네틱스 및 영역 영상 촬영을 위한 고해상도 현미경
비접촉 자기 측정용 웨이퍼 스케일 히스테레시스 루프 추적기
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
비접촉 자기 측정용 웨이퍼 스케일 히스테레시스 루프 추적기
진동 샘플 자력계
정확한 자기 특성 측정 시스템 높은 감수성 VSM
High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder
정확한 자기 특성 측정 시스템 높은 감수성 VSM
고감도 진동 시료 자력계, 첨단 재료 연구용 광범위 온도 VSM
VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field
고감도 진동 시료 자력계, 첨단 재료 연구용 광범위 온도 VSM
고속 진동 샘플 마그네토미터 다재다능 자석 성질 측정 시스템
VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate
고속 진동 샘플 마그네토미터 다재다능 자석 성질 측정 시스템
마그네토 광학 극저온 장치
고자기장 광학 극저온 냉각기 초전도 자석 냉각기 저온 자기 광학용
High Field Optical Cryostat For Low Temperature Magneto Optics Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge product designed for precise and reliable optical property measurements in a wide temperature range. This advanced cryostat features multiple electrical channels, exceptional temperature stability, and high-quality optical windows, making it ideal for a variety of research
고자기장 광학 극저온 냉각기 초전도 자석 냉각기 저온 자기 광학용
통합 자기 광학 극저온 냉각기 분광학 및 양자 물질용
Magneto Optical Cryostat With Magnet For Spectroscopy And Quantum Materials Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat, also known as MO-Cryostat, offers a wide temperature range, with the ability to operate within temperatures ranging from 1.7 K to 350 K. This extensive temperature range allows for versatile experimental conditions and precise measurements across various temperature regimes. Equipped
통합 자기 광학 극저온 냉각기 분광학 및 양자 물질용
초전도 자석 크리오스타트 자유 공간 광학 접근과 함께 과학 저 온도 크리오스타트
Superconducting Magnet Cryostat With Free Space Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed to meet the demanding requirements of low-temperature experiments in various scientific fields. This innovative cryostat offers a wide temperature range from 1.7 K to 350 K, making it suitable for a diverse range of experiments that require precise temperature control. One of the key features of the Magneto Optical Cryostat
초전도 자석 크리오스타트 자유 공간 광학 접근과 함께 과학 저 온도 크리오스타트
극저온 프로브 스테이션
자기장 냉동 탐사 기지 360도 탐사 기지
Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The
자기장 냉동 탐사 기지 360도 탐사 기지
자동 냉동 탐사 기지 자기장 탐사 기지
Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and
자동 냉동 탐사 기지 자기장 탐사 기지
360도 반도체 프로브 스테이션 저온 진공 프로브 스테이션 스핀트로닉스용
Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature
360도 반도체 프로브 스테이션 저온 진공 프로브 스테이션 스핀트로닉스용
MRAM 테스터
트라이 템프 자기 칩 테스터 고신뢰성 검증용 정밀 최종 테스터
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
트라이 템프 자기 칩 테스터 고신뢰성 검증용 정밀 최종 테스터
정밀 MRAM 검사자 자기 칩 생산 라인을 위한 자동 최종 시험 시스템
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
정밀 MRAM 검사자 자기 칩 생산 라인을 위한 자동 최종 시험 시스템
자기 프로브 스테이션
실험실 매뉴얼 웨이퍼 프로브 스테이션 자기장 프로빙 스테이션 360도 회전
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
실험실 매뉴얼 웨이퍼 프로브 스테이션 자기장 프로빙 스테이션 360도 회전
50 MT 자기 탐사 역 RH 테스트 웨이퍼 자기 필름 측정용 탐사 역
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
50 MT 자기 탐사 역 RH 테스트 웨이퍼 자기 필름 측정용 탐사 역
고 정밀 RF 프로브 스테이션 50 MT 수동 웨이퍼 프로버
Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key
