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Atomic Force Microscope

Quality Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution factory

Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers

Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution

Quality 0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis factory

0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis

Quality 0.1Hz - 30Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes factory

0.1Hz - 30Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

0.1Hz - 30Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes

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Kerr Microscope

Quality High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization factory

High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

Quality Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control factory

Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control

Quality Low Temp High Field Kerr Microscope Laser MOKE Microscope For Micro Region Imaging factory

Low Temp High Field Kerr Microscope Laser MOKE Microscope For Micro Region Imaging

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

Low Temp High Field Kerr Microscope Laser MOKE Microscope For Micro Region Imaging

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Vibrating Sample Magnetometer

Quality Turnkey VSM Systems High Accuracy Vibrating Magnetometer For Fast And Reliable Magnetic Measurements factory

Turnkey VSM Systems High Accuracy Vibrating Magnetometer For Fast And Reliable Magnetic Measurements

Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and

Turnkey VSM Systems High Accuracy Vibrating Magnetometer For Fast And Reliable Magnetic Measurements

Quality High Accuracy Vibrating Sample Magnetometer Low Noise VSM System For High Field Options factory

High Accuracy Vibrating Sample Magnetometer Low Noise VSM System For High Field Options

Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its

High Accuracy Vibrating Sample Magnetometer Low Noise VSM System For High Field Options

Quality High Precision Vibrating Magnetometer High Sensitivity VSM Magnetometer factory

High Precision Vibrating Magnetometer High Sensitivity VSM Magnetometer

High-Precision Vibrating Sample Magnetometer Product Introduction The TIM-70 high-precision vibrating sample magnetometer, independently developed by Zhizhen Precision, measures magnetization curves, hysteresis loops, demagnetization curves, heating curves, cooling curves, and other magnetic parameters such as saturation magnetization, remanent magnetization, coercive force, maximum energy product, Curie temperature, superconducting transition temperature, Néel temperature,

High Precision Vibrating Magnetometer High Sensitivity VSM Magnetometer

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Cryogenic Probe Station

Quality High Precision Cryogenic Probe Station Cryo Probe Stations For Spintronics 2D Materials And Superconductors factory

High Precision Cryogenic Probe Station Cryo Probe Stations For Spintronics 2D Materials And Superconductors

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

High Precision Cryogenic Probe Station Cryo Probe Stations For Spintronics 2D Materials And Superconductors

Quality Vertical Field Cryo Probe Station Cryogen Free Low Temperature Probe Station factory

Vertical Field Cryo Probe Station Cryogen Free Low Temperature Probe Station

Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field

Vertical Field Cryo Probe Station Cryogen Free Low Temperature Probe Station

Quality Precise Cryogenic Probe Station Cryogen Free Probe Station For Automated Magnetic Measurements factory

Precise Cryogenic Probe Station Cryogen Free Probe Station For Automated Magnetic Measurements

Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature

Precise Cryogenic Probe Station Cryogen Free Probe Station For Automated Magnetic Measurements

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Magnetic Probe Station

Quality In Plane And Vertical Magnetic Probe Station 140 MT Wafer Prober For Advanced Testing factory

In Plane And Vertical Magnetic Probe Station 140 MT Wafer Prober For Advanced Testing

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

In Plane And Vertical Magnetic Probe Station 140 MT Wafer Prober For Advanced Testing

Quality 140 MT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing factory

140 MT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

140 MT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing

Quality Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization factory

Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization

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