AtomExplorer: Sub-Nanometer Resolution Atomic Force Microscope

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable instrument designed to deliver precise nanoscale topography imaging with exceptional accuracy and stability. Engineered for researchers and professionals who demand high-performance scanning capabilities, this AFM offers a comprehensive suite of features that make it an indispensable tool in the field of nanotechnology and materials science.

One of the standout features of this Basic-type Atomic Force Microscope is its impressive scanning range. It supports two modes of operation: a wide scanning range of 100 μm * 100 μm * 10 μm and a more focused, higher resolution mode of 30 μm * 30 μm * 5 μm. This flexibility enables users to capture detailed surface structures across a variety of sample sizes and types, making it ideal for both broad surveys and in-depth analyses at the nanoscale level.

The microscope utilizes an XYZ three-axis full-sample scanning method, which ensures comprehensive coverage and precise control over the scanning process. This advanced scanning technique allows the instrument to maintain consistent accuracy and repeatability across the entire sample surface. Whether you are examining flat surfaces or complex topographies, the three-axis scanning capability guarantees thorough and reliable imaging results.

Accommodating samples up to a diameter of Φ 25 mm, the Basic-type AFM provides ample space for a wide range of specimen sizes. This capacity makes it suitable for various research applications, including semiconductor materials, biological samples, polymers, and other nanostructured materials. The large sample size compatibility enhances the instrument's versatility and usability in diverse scientific investigations.

In addition to standard topographical imaging, this AFM model includes multifunctional measurement capabilities that significantly expand its application range. It can function as an Electrostatic Force Microscope (EFM), allowing for the analysis of surface charge distributions and electrostatic properties. As a Scanning Kelvin Probe Microscope (KPFM), it provides valuable information on surface potential and work function variations, which are critical in materials science and semiconductor research.

The Basic-type Atomic Force Microscope also supports Piezoelectric Force Microscopy (PFM), enabling the study of piezoelectric and ferroelectric materials by measuring electromechanical responses at the nanoscale. Furthermore, it operates as a Magnetic Force Microscope (MFM), which is essential for investigating magnetic domains and nanomagnetic structures. These multifunctional modes make the instrument a powerful analytical platform for comprehensive surface and material characterization.

Another critical aspect of the Basic-type AFM is its exceptional Z-axis noise level, which is as low as 0.04 nm. This ultra-low noise floor is a testament to the instrument's high stability design and precision engineering, ensuring that even the most subtle surface features are accurately captured without interference or distortion. The low noise level is particularly beneficial when performing sensitive measurements that require high resolution and repeatability.

For researchers and laboratories looking to Buy Atomic Force Microscope equipment that combines reliability, advanced functionality, and ease of use, the Basic-type Atomic Force Microscope stands out as an excellent choice. Its high stability AFM design guarantees consistent performance, enabling users to conduct detailed nanoscale investigations with confidence.

In summary, the Basic-type Atomic Force Microscope offers a perfect balance of scanning range, multifunctional measurement capabilities, and precision performance. Whether for academic research, industrial applications, or quality control, this instrument provides nanoscale topography imaging with superior accuracy and versatility. Its robust features and user-friendly operation make it an essential asset for anyone seeking to explore and understand material properties at the nanoscale.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM)
• Supports Kelvin Probe Force Microscopy for advanced surface potential analysis
• Scanning Method: XYZ Three-Axis Full-Sample Scanning for comprehensive sample coverage
• Z-Axis Noise Level: 0.04 Nm ensuring high precision and sensitivity
• Sample Size Compatibility: Φ 25 Mm accommodating a wide range of specimens
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode for versatile imaging options
• Offers Customizable AFM solutions tailored to specific research needs
• Designed as a Nanoscale Microscope for detailed surface characterization at the nanometer scale

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer, a Basic-type Atomic Force Microscope (AFM) originating from China, is designed to cater to a wide range of product application occasions and scenarios. Its versatile capabilities make it an indispensable tool for researchers, scientists, and engineers working in nanotechnology, materials science, semiconductor research, and biological studies.

One of the primary application occasions for the AtomExplorer AFM Microscope is in nanoscale topography imaging. The XYZ Three-Axis Full-Sample Scanning method allows for precise and comprehensive scanning of sample surfaces up to Φ 25 mm in size, enabling detailed visualization of surface structures at the nanoscale. This makes it ideal for characterizing materials such as thin films, polymers, nanocomposites, and biological samples where surface morphology plays a crucial role.

The multifunctional measurement capabilities of the AtomExplorer expand its usability significantly. With integrated modes such as Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM), the instrument can be employed in diverse research scenarios. For example, Magnetic Force Microscopy MFM allows for the investigation of magnetic domains and properties in magnetic materials, making it essential in data storage research and spintronics.

Operating modes like Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode offer flexibility in imaging different types of samples with varying mechanical properties. Tap Mode is often used for soft or delicate specimens, while Contact Mode provides high-resolution imaging for rigid surfaces. Lift Mode helps in separating topographic and magnetic or electrostatic signals during MFM and EFM measurements, enhancing data clarity.

Furthermore, the AtomExplorer incorporates Safe Needle Insertion Mode, a tip protection technology that ensures the longevity of the probe tip and prevents damage during sample engagement, reducing downtime and maintenance costs. This feature is particularly beneficial in high-throughput environments where reliability and precision are paramount.

In summary, the Truth Instruments AtomExplorer is a highly adaptable AFM Microscope suitable for applications requiring detailed nanoscale topography imaging and multifunctional force measurements. Whether used in academic research, industrial quality control, or advanced material development, this instrument’s comprehensive features and scanning capabilities make it an excellent choice. For pricing, the price is negotiable, and interested customers are encouraged to contact Truth Instruments for a detailed quote.