
Wafer Scale Hysteresis Loop Tracer For Non Contact Magnetic Metrology
Wafer Scale Hysteresis Loop Tracer
,Non Contact Hysteresis Loop Tracer
,Magnetic Metrology Hysteresis Loop Tracer
Basic Properties
Trading Properties
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology
Product Description:
The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes.
One of the key features of this product is its exceptional Sample Repeatability, which is better than 10 μm. This level of precision ensures consistent and reliable results, crucial for analyzing magnetic properties with high accuracy.
When it comes to Sample Size compatibility, this instrument is versatile and supports samples up to 12 inches and below. Additionally, it is capable of handling fragment testing, offering flexibility in sample preparation and testing procedures.
The Wafer-Level Hysteresis Loop Measurement Instrument boasts powerful Magnetic Field capabilities, with a vertical range of ±2.4 T and an in-plane range of ±1.3 T. These magnetic field strengths enable comprehensive characterization of magnetic materials, making it an ideal tool for Wafer Level Magnetic Characterization.
For added convenience and efficiency, an EFEM (Equipment Front End Module) is optional with this instrument. The EFEM integration streamlines the testing process and enhances overall productivity, especially in high-throughput production environments.
Testing Efficiency is a standout feature of this instrument, offering a testing speed of 12 WPH (Wafers Per Hour) at ±1.3 T with 9 Sites Measurement on a 200 mm wafer. This high testing throughput makes the instrument suitable for production line MOKE (Magneto-Optical Kerr Effect) testing, where rapid and reliable measurements are essential.
Features:
- Product Name: Wafer-Level Hysteresis Loop Measurement Instrument
- Magnetic Field Resolution: PID Closed-loop Feedback Regulation, 0.01 MT
- Testing Functions:
- Non-destructive Hysteresis Loop Measurement Of Magnetic Stacks/devices
- Automatic Extraction Of Hysteresis Loop Information (free Layer And Pinned Layer Hc, Hex, M (Kerr Angle Value))
- Rapid Mapping Of Wafer Magnetic Characteristic Distribution
- Sample Repeatability: Better Than 10 μm
- Magnetic Field: Vertical ±2.4 T; In-plane ±1.3 T
- Kerr Angle Resolution: 0.3 Mdeg (RMS)
Technical Parameters:
Uptime | 90% |
Magnetic Field Resolution | PID Closed-loop Feedback Regulation, 0.01 MT |
EFEM | Optional |
Kerr Angle Resolution | 0.3 Mdeg (RMS) |
Testing Efficiency | 12 WPH@±1.3 T /9 Sites Measurement/200 Mm Wafer |
Magnetic Field Uniformity | Better Than ±1%@Φ1 Mm |
Sample Repeatability | Better Than 10 μm |
Magnetic Field | Vertical ±2.4 T; In-plane ±1.3 T |
Testing Functions | Non-destructive Hysteresis Loop Measurement Of Magnetic Stacks/devices, Automatic Extraction Of Hysteresis Loop Information (free Layer And Pinned Layer Hc, Hex, M (Kerr Angle Value)), And Rapid Mapping Of Wafer Magnetic Characteristic Distribution |
Sample Size | Compatible With 12-inch And Below, Supports Fragment Testing |
Applications:
Truth Instruments' Wafer-MOKE is a cutting-edge Magnetic Metrology Tool designed for precise hysteresis loop measurements in a variety of scenarios. With its exceptional capabilities and advanced features, this instrument is ideal for a range of Product Application Occasions and Scenarios.
Originating from CHINA, the Wafer-MOKE is engineered to deliver unparalleled performance and efficiency. Its high Testing Efficiency of 12 WPH@±1.3 T /9 Sites Measurement/200 Mm Wafer ensures quick and accurate testing processes, making it a valuable asset in research facilities, manufacturing plants, and academic institutions.
One of the standout features of this product is its remarkable Magnetic Field Uniformity, surpassing ±1%@Φ1 Mm. This level of precision is essential for applications requiring consistency and reliability, such as MRAM Testing and magnetic material characterization.
The Wafer-MOKE boasts a powerful Magnetic Field capacity, with Vertical ±2.4 T and In-plane ±1.3 T capabilities. This flexibility enables users to conduct a wide range of experiments and measurements, catering to diverse research needs.
Equipped with a Kerr Angle Resolution of 0.3 Mdeg (RMS), this instrument offers exceptional accuracy in capturing subtle magnetic variations. Researchers and scientists working on magnetic domain studies and material analysis will find the Wafer-MOKE indispensable for their projects.
Moreover, the instrument's compatibility with sample sizes up to 12 inches and below, as well as its support for Fragment Testing, further enhances its versatility and applicability. Whether analyzing small fragments or larger wafers, the Wafer-MOKE offers the flexibility needed for comprehensive magnetic measurements.
In conclusion, the Truth Instruments Wafer-MOKE is a state-of-the-art product that excels in Wafer Scale MOKE applications, making it an indispensable tool for magnetic metrology, MRAM testing, and various research endeavors.