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Атомный силовый микроскоп
Микроскоп высокой сканирующей силы 0,15 Нм Микроскоп высокого разрешения для волокна
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
Микроскоп высокой сканирующей силы 0,15 Нм Микроскоп высокого разрешения для волокна
Все в одном Микроскоп атомной силы Многофункциональные биологические микроскопы для гибкой и точной работы
All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the
Все в одном Микроскоп атомной силы Многофункциональные биологические микроскопы для гибкой и точной работы
Настраиваемая АСМ система для научных и промышленных материалов, микроскопы с высокой масштабируемостью
Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key
Настраиваемая АСМ система для научных и промышленных материалов, микроскопы с высокой масштабируемостью
Керр микроскоп
250 нм Керр микроскоп высокого разрешения
Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and
250 нм Керр микроскоп высокого разрешения
Продвинутый микроскоп Керра Микроскоп высокого разрешения для микромагнетики и доменной визуализации
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
Продвинутый микроскоп Керра Микроскоп высокого разрешения для микромагнетики и доменной визуализации
Трассировщик петли гистерезиса для пластин большого размера для бесконтактной магнитной метрологии
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
Трассировщик петли гистерезиса для пластин большого размера для бесконтактной магнитной метрологии
Вибрирующий магнитометр образца
Система точного измерения магнитных свойств, высокочувствительный VSM
High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder
Система точного измерения магнитных свойств, высокочувствительный VSM
Вибрационный магнитометр с высокой чувствительностью и широким диапазоном температур для исследования передовых материалов
VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field
Вибрационный магнитометр с высокой чувствительностью и широким диапазоном температур для исследования передовых материалов
Высокоскоростной вибромагнитометр для измерения магнитных свойств
VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate
Высокоскоростной вибромагнитометр для измерения магнитных свойств
Магнето оптический криостат
Оптический криостат высокого поля для магнитооптики при низких температурах со сверхпроводящим магнитом
High Field Optical Cryostat For Low Temperature Magneto Optics Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge product designed for precise and reliable optical property measurements in a wide temperature range. This advanced cryostat features multiple electrical channels, exceptional temperature stability, and high-quality optical windows, making it ideal for a variety of research
Оптический криостат высокого поля для магнитооптики при низких температурах со сверхпроводящим магнитом
Интегрированный магнитооптический криостат
Magneto Optical Cryostat With Magnet For Spectroscopy And Quantum Materials Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat, also known as MO-Cryostat, offers a wide temperature range, with the ability to operate within temperatures ranging from 1.7 K to 350 K. This extensive temperature range allows for versatile experimental conditions and precise measurements across various temperature regimes. Equipped
Интегрированный магнитооптический криостат
Сверхпроводящий магнитный криостат Научный низкотемпературный криостат с свободным оптическим доступом
Superconducting Magnet Cryostat With Free Space Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed to meet the demanding requirements of low-temperature experiments in various scientific fields. This innovative cryostat offers a wide temperature range from 1.7 K to 350 K, making it suitable for a diverse range of experiments that require precise temperature control. One of the key features of the Magneto Optical Cryostat
Сверхпроводящий магнитный криостат Научный низкотемпературный криостат с свободным оптическим доступом
Криогенная зондовая станция
Криогенная зондовая станция с магнитным полем, обеспечивающая зондирование на 360 градусов
Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The
Криогенная зондовая станция с магнитным полем, обеспечивающая зондирование на 360 градусов
Автоматизированная криогенная зондовая станция с магнитным полем
Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and
Автоматизированная криогенная зондовая станция с магнитным полем
360-градусная полупроводниковая зондирующая станция низкотемпературная вакуумная зондирующая станция для спинтроники
Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature
360-градусная полупроводниковая зондирующая станция низкотемпературная вакуумная зондирующая станция для спинтроники
Тестировщик MRAM
Прецизионный финальный тестер магнитных чипов Tri Temp для верификации высокой надежности
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
Прецизионный финальный тестер магнитных чипов Tri Temp для верификации высокой надежности
Система автоматизированного окончательного испытания для производственных линий магнитных чипов
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
Система автоматизированного окончательного испытания для производственных линий магнитных чипов
Магнитная зондовая станция
Лабораторное руководство. Станция для зондирования пластин, станция для измерения магнитного поля с вращением на 360 градусов
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
Лабораторное руководство. Станция для зондирования пластин, станция для измерения магнитного поля с вращением на 360 градусов
50 MT магнитная зондовая станция для тестирования RH, зондовые станции для пластин для измерения магнитной пленки
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
50 MT магнитная зондовая станция для тестирования RH, зондовые станции для пластин для измерения магнитной пленки
Высокоточная RF зондовая станция 50 MT, ручной пробник для пластин для магниторезистивности
Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key
