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Atomkraftmikroskop
Hochauflösendes Rasterkraftmikroskop 0,15 Nm für Wafer
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
Hochauflösendes Rasterkraftmikroskop 0,15 Nm für Wafer
All-in-one Atomkraftmikroskop Multifunktionale Biomikroskope für flexiblen und präzisen Betrieb
All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the
All-in-one Atomkraftmikroskop Multifunktionale Biomikroskope für flexiblen und präzisen Betrieb
Anpassungsfähiges AFM-System Wissenschaftliche industrielle Materialien Mikroskope mit hoher Skalierbarkeit
Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key
Anpassungsfähiges AFM-System Wissenschaftliche industrielle Materialien Mikroskope mit hoher Skalierbarkeit
Kerr -Mikroskop
250 Nm Kerr-Mikroskop mit hoher Auflösung für magnetooptischen Kerr-Effekt
Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and
250 Nm Kerr-Mikroskop mit hoher Auflösung für magnetooptischen Kerr-Effekt
Fortgeschrittenes Kerr-Mikroskop Mikroskop mit hoher Auflösung für Mikromagnetik und Domänenbildgebung
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
Fortgeschrittenes Kerr-Mikroskop Mikroskop mit hoher Auflösung für Mikromagnetik und Domänenbildgebung
Wafer-Scale-Hystereseschleifentester für berührungslose magnetische Metrologie
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
Wafer-Scale-Hystereseschleifentester für berührungslose magnetische Metrologie
Vibrierender Probenmagnetometer
Präzises Magneteigenschafts-Messsystem Hohe Empfindlichkeit VSM
High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder
Präzises Magneteigenschafts-Messsystem Hohe Empfindlichkeit VSM
Hochempfindliches Schwingungsmagnetometer mit großem Temperaturbereich (VSM) für die Forschung an modernen Materialien
VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field
Hochempfindliches Schwingungsmagnetometer mit großem Temperaturbereich (VSM) für die Forschung an modernen Materialien
Hochgeschwindigkeits-Schwingungsmagnetometer, vielseitiges Messsystem für magnetische Eigenschaften
VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate
Hochgeschwindigkeits-Schwingungsmagnetometer, vielseitiges Messsystem für magnetische Eigenschaften
Magneto optischer Kryostat
Hochfeld-Optik-Kryostat Supraleitender Magnet-Kryostat für Tieftemperatur-Magnetooptik
High Field Optical Cryostat For Low Temperature Magneto Optics Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge product designed for precise and reliable optical property measurements in a wide temperature range. This advanced cryostat features multiple electrical channels, exceptional temperature stability, and high-quality optical windows, making it ideal for a variety of research
Hochfeld-Optik-Kryostat Supraleitender Magnet-Kryostat für Tieftemperatur-Magnetooptik
Integrierter magneto-optischer Kryostat Magnet Tieftemperatur-Kryostat für Spektroskopie und Quantenmaterialien
Magneto Optical Cryostat With Magnet For Spectroscopy And Quantum Materials Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat, also known as MO-Cryostat, offers a wide temperature range, with the ability to operate within temperatures ranging from 1.7 K to 350 K. This extensive temperature range allows for versatile experimental conditions and precise measurements across various temperature regimes. Equipped
Integrierter magneto-optischer Kryostat Magnet Tieftemperatur-Kryostat für Spektroskopie und Quantenmaterialien
Supraleitender Magnet Kryostat Wissenschaftlicher Niedertemperatur-Kryostat mit freiem Raumoptikzugang
Superconducting Magnet Cryostat With Free Space Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed to meet the demanding requirements of low-temperature experiments in various scientific fields. This innovative cryostat offers a wide temperature range from 1.7 K to 350 K, making it suitable for a diverse range of experiments that require precise temperature control. One of the key features of the Magneto Optical Cryostat
Supraleitender Magnet Kryostat Wissenschaftlicher Niedertemperatur-Kryostat mit freiem Raumoptikzugang
Kryogene Sondenstation
Magnetfeld-Kryo-Probestation für 360-Grad-Probing
Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The
Magnetfeld-Kryo-Probestation für 360-Grad-Probing
Automatisierte kryogene Probestations-Magnetfeld-Probestation
Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and
Automatisierte kryogene Probestations-Magnetfeld-Probestation
360-Grad-Halbleitersonde-Station Niedertemperatur-Vakuumsonde-Station für Spintronik
Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature
360-Grad-Halbleitersonde-Station Niedertemperatur-Vakuumsonde-Station für Spintronik
MRAM-Tester
Tri Temp Magnetchip Tester Präzision Endtester für die Überprüfung der hohen Zuverlässigkeit
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
Tri Temp Magnetchip Tester Präzision Endtester für die Überprüfung der hohen Zuverlässigkeit
Präzisions-MRAM-Tester Automatisiertes Endprüfsystem für Produktionslinien für Magnetchips
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
Präzisions-MRAM-Tester Automatisiertes Endprüfsystem für Produktionslinien für Magnetchips
Magnetsondenstation
Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
50 MT Magnetische Sondenstation RH-Tests Wafer-Sondenstationen für Magnetfilm-Messung
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
50 MT Magnetische Sondenstation RH-Tests Wafer-Sondenstationen für Magnetfilm-Messung
Hochpräzise HF-Prüfstation 50 MT Manueller Wafer-Prober für Magnetoresistenz
Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key
