logo

Atomkraftmikroskop

Qualität 0,04nm Rasterkraftmikroskop 0,1Hz - 30Hz AFM Mikroskop für präzise Oberflächenanalyse im Nanobereich Fabrik

0,04nm Rasterkraftmikroskop 0,1Hz - 30Hz AFM Mikroskop für präzise Oberflächenanalyse im Nanobereich

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

0,04nm Rasterkraftmikroskop 0,1Hz - 30Hz AFM Mikroskop für präzise Oberflächenanalyse im Nanobereich

Qualität 0.1Hz - 30Hz Atomkraftmikroskop Mikroskope für Nanoskala-Scan-Sonden Fabrik

0.1Hz - 30Hz Atomkraftmikroskop Mikroskope für Nanoskala-Scan-Sonden

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

0.1Hz - 30Hz Atomkraftmikroskop Mikroskope für Nanoskala-Scan-Sonden

Qualität Kraftmodulations-Rasterkraftmikroskop Hochauflösendes Wissenschaftsmikroskop 0,04 nm Fabrik

Kraftmodulations-Rasterkraftmikroskop Hochauflösendes Wissenschaftsmikroskop 0,04 nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

Kraftmodulations-Rasterkraftmikroskop Hochauflösendes Wissenschaftsmikroskop 0,04 nm

Ansicht mehr

Kerr -Mikroskop

Qualität Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung Fabrik

Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung

Qualität Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle Fabrik

Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle

Qualität Tieftemperatur-Hochfeld-Kerr-Mikroskop Laser-MOKE-Mikroskop für Mikroregionen-Bildgebung Fabrik

Tieftemperatur-Hochfeld-Kerr-Mikroskop Laser-MOKE-Mikroskop für Mikroregionen-Bildgebung

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

Tieftemperatur-Hochfeld-Kerr-Mikroskop Laser-MOKE-Mikroskop für Mikroregionen-Bildgebung

Ansicht mehr

Vibrierender Probenmagnetometer

Qualität Schlüsselfertige VSM-Systeme Hochpräzisions-Schwingungsmagnetometer für schnelle und zuverlässige magnetische Messungen Fabrik

Schlüsselfertige VSM-Systeme Hochpräzisions-Schwingungsmagnetometer für schnelle und zuverlässige magnetische Messungen

Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and

Schlüsselfertige VSM-Systeme Hochpräzisions-Schwingungsmagnetometer für schnelle und zuverlässige magnetische Messungen

Qualität Hochgenaue Vibrationsprobe Magnetometer Geräuscharme VSM-System für hohe Feldoptionen Fabrik

Hochgenaue Vibrationsprobe Magnetometer Geräuscharme VSM-System für hohe Feldoptionen

Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its

Hochgenaue Vibrationsprobe Magnetometer Geräuscharme VSM-System für hohe Feldoptionen

Qualität Hochpräzisions-Schwingmagnetometer Hohe Empfindlichkeit VSM-Magnetometer Fabrik

Hochpräzisions-Schwingmagnetometer Hohe Empfindlichkeit VSM-Magnetometer

High-Precision Vibrating Sample Magnetometer Product Introduction The TIM-70 high-precision vibrating sample magnetometer, independently developed by Zhizhen Precision, measures magnetization curves, hysteresis loops, demagnetization curves, heating curves, cooling curves, and other magnetic parameters such as saturation magnetization, remanent magnetization, coercive force, maximum energy product, Curie temperature, superconducting transition temperature, Néel temperature,

Hochpräzisions-Schwingmagnetometer Hohe Empfindlichkeit VSM-Magnetometer

Ansicht mehr

Kryogene Sondenstation

Qualität Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter Fabrik

Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter

Qualität Vertikalfeld-Kryosonde-Station Kryogenfreie Niedertemperatursonde-Station Fabrik

Vertikalfeld-Kryosonde-Station Kryogenfreie Niedertemperatursonde-Station

Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field

Vertikalfeld-Kryosonde-Station Kryogenfreie Niedertemperatursonde-Station

Qualität Präzise Kryo-Probestation Fabrik

Präzise Kryo-Probestation

Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature

Präzise Kryo-Probestation

Ansicht mehr

Magnetsondenstation

Qualität In-Plane- und Vertikal-Magnetprobenstation 140 MT Wafer Prober für fortschrittliche Tests Fabrik

In-Plane- und Vertikal-Magnetprobenstation 140 MT Wafer Prober für fortschrittliche Tests

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

In-Plane- und Vertikal-Magnetprobenstation 140 MT Wafer Prober für fortschrittliche Tests

Qualität 140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests Fabrik

140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests

Qualität Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung Fabrik

Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung

Ansicht mehr