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原子力顕微鏡

品質高スキャン力顕微鏡 0.15 Nm 高解像度顕微鏡工場 — 高スキャン力顕微鏡 0.15 Nm 高解像度顕微鏡

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

品質オールインワン原子間力顕微鏡多機能生物顕微鏡柔軟で精密な操作用工場 — オールインワン原子間力顕微鏡多機能生物顕微鏡柔軟で精密な操作用

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the

品質カスタマイズ可能なAFMシステム科学産業材料顕微鏡強力なスケーラビリティ工場 — カスタマイズ可能なAFMシステム科学産業材料顕微鏡強力なスケーラビリティ

Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key

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カー顕微鏡

品質 250 nm ケル顕微鏡高分解能磁気光学カー効果顕微鏡工場 — 250 nm ケル顕微鏡高分解能磁気光学カー効果顕微鏡

Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and

品質高解像度顕微鏡微磁気と領域画像のための顕微鏡工場 — 高解像度顕微鏡微磁気と領域画像のための顕微鏡

Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this

品質非接触磁気計測用ウェーハースケールヒステリシスループトレーサー工場 — 非接触磁気計測用ウェーハースケールヒステリシスループトレーサー

Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is

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振動サンプル磁力計

品質高感度VSM 精密磁気特性測定システム工場 — 高感度VSM 精密磁気特性測定システム

High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder

品質高感度振動サンプル磁気計幅広い温度範囲 VSM 高級材料研究用工場 — 高感度振動サンプル磁気計幅広い温度範囲 VSM 高級材料研究用

VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field

品質高速振動サンプル磁気計汎用磁気特性測定システム工場 — 高速振動サンプル磁気計汎用磁気特性測定システム

VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate

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マグニートー光クライオスタット

品質高磁場光学クライオスタット超伝導磁石クライオスタット低温磁気光学用工場 — 高磁場光学クライオスタット超伝導磁石クライオスタット低温磁気光学用

High Field Optical Cryostat For Low Temperature Magneto Optics Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge product designed for precise and reliable optical property measurements in a wide temperature range. This advanced cryostat features multiple electrical channels, exceptional temperature stability, and high-quality optical windows, making it ideal for a variety of research

品質インテグレテッドマグネトオプティカルクリオスタットマグネト低温クリオスタット光譜学と量子材料工場 — インテグレテッドマグネトオプティカルクリオスタットマグネト低温クリオスタット光譜学と量子材料

Magneto Optical Cryostat With Magnet For Spectroscopy And Quantum Materials Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat, also known as MO-Cryostat, offers a wide temperature range, with the ability to operate within temperatures ranging from 1.7 K to 350 K. This extensive temperature range allows for versatile experimental conditions and precise measurements across various temperature regimes. Equipped

品質超伝導磁石クライオスタット科学低温クライオスタット自由空間光学アクセス付き工場 — 超伝導磁石クライオスタット科学低温クライオスタット自由空間光学アクセス付き

Superconducting Magnet Cryostat With Free Space Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed to meet the demanding requirements of low-temperature experiments in various scientific fields. This innovative cryostat offers a wide temperature range from 1.7 K to 350 K, making it suitable for a diverse range of experiments that require precise temperature control. One of the key features of the Magneto Optical Cryostat

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極低温プローブステーション

品質磁場冷凍探査ステーション 360度探査ステーション工場 — 磁場冷凍探査ステーション 360度探査ステーション

Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The

品質自動化冷凍探査ステーション磁場探査ステーション工場 — 自動化冷凍探査ステーション磁場探査ステーション

Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and

品質 360度半導体プローブステーション低温真空プローブステーションスピントロニクス用工場 — 360度半導体プローブステーション低温真空プローブステーションスピントロニクス用

Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature

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MRAMテスター

品質三温磁気チップテスター高信頼性検証用精密最終テスター工場 — 三温磁気チップテスター高信頼性検証用精密最終テスター

Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable

品質磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム工場 — 磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム

Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the

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磁気プローブステーション

品質ラボマニュアルワッファー探査ステーション 360 回転する磁場探査ステーション工場 — ラボマニュアルワッファー探査ステーション 360 回転する磁場探査ステーション

Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti

品質 50 MT 磁気プローブステーション RH テスト磁性膜測定用ウェーハプローブステーション工場 — 50 MT 磁気プローブステーション RH テスト磁性膜測定用ウェーハプローブステーション

Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of

品質高精度RF探査ステーション 50 MT マグネトレジスタンスのためのマニュアル・ウェーファー探査機工場 — 高精度RF探査ステーション 50 MT マグネトレジスタンスのためのマニュアル・ウェーファー探査機

Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key

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