品質原子力顕微鏡中国からの製造業者 of page 3

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原子力顕微鏡

品質 00.04nm 原子力顕微鏡 0.1Hz - 30Hz 精密なナノスケール表面分析のためのAFM顕微鏡工場 — 00.04nm 原子力顕微鏡 0.1Hz - 30Hz 精密なナノスケール表面分析のためのAFM顕微鏡

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

品質 0.1Hz - 30Hz 原子力顕微鏡ナノスケールスキャン探査機顕微鏡工場 — 0.1Hz - 30Hz 原子力顕微鏡ナノスケールスキャン探査機顕微鏡

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

品質力変調走査型原子間力顕微鏡高分解能科学顕微鏡 0.04 nm 工場 — 力変調走査型原子間力顕微鏡高分解能科学顕微鏡 0.04 nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

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カー顕微鏡

品質高フィールド・ウェーファー測定システム MRAMと磁気フィルムの特徴付けのためのMOKE・ウェーファースキャン工場 — 高フィールド・ウェーファー測定システム MRAMと磁気フィルムの特徴付けのためのMOKE・ウェーファースキャン

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

品質ウェーハレベルMOKEシステム 0.3 Mdeg 高速ヒステリシスループとプロセス制御用工場 — ウェーハレベルMOKEシステム 0.3 Mdeg 高速ヒステリシスループとプロセス制御用

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

品質低温高磁場カー顕微鏡レーザーMOKE顕微鏡微小領域イメージング用工場 — 低温高磁場カー顕微鏡レーザーMOKE顕微鏡微小領域イメージング用

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

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振動サンプル磁力計

品質トンキーVSMシステム高精度振動磁気計迅速かつ信頼性の高い磁気測定工場 — トンキーVSMシステム高精度振動磁気計迅速かつ信頼性の高い磁気測定

Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and

品質高精度振動試料型磁力計低ノイズ VSM システム高磁場オプション用工場 — 高精度振動試料型磁力計低ノイズ VSM システム高磁場オプション用

Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its

品質高精度振動磁気計高感度VSM磁気計工場 — 高精度振動磁気計高感度VSM磁気計

High-Precision Vibrating Sample Magnetometer Product Introduction The TIM-70 high-precision vibrating sample magnetometer, independently developed by Zhizhen Precision, measures magnetization curves, hysteresis loops, demagnetization curves, heating curves, cooling curves, and other magnetic parameters such as saturation magnetization, remanent magnetization, coercive force, maximum energy product, Curie temperature, superconducting transition temperature, Néel temperature,

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マグニートー光クライオスタット

品質精密磁気光学クライオスタット統合磁石クライオスタットフレキシブルな低温測定用工場 — 精密磁気光学クライオスタット統合磁石クライオスタットフレキシブルな低温測定用

Integrated Magneto Optical Cryostat For Flexible Cryo Measurements Product Description: The Magneto Optical Cryostat is a cutting-edge device designed for advanced research in the field of magneto optical measurements. With its exceptional features and superior performance, this cryostat offers researchers a powerful tool to conduct experiments in high magnetic fields with precision and accuracy. One of the standout attributes of this cryostat is its optical windows

品質 1.7 K - 350 K マグネットオプティカルクリオスタット超伝導性MO クリオスタット工場 — 1.7 K - 350 K マグネットオプティカルクリオスタット超伝導性MO クリオスタット

Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate

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極低温プローブステーション

品質高精度冷凍探査ステーションスピントロニクス 2D 材料と超伝導体のための冷凍探査ステーション工場 — 高精度冷凍探査ステーションスピントロニクス 2D 材料と超伝導体のための冷凍探査ステーション

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

品質垂直磁場クライオプローブステーション液体ヘリウムフリー低温プローブステーション工場 — 垂直磁場クライオプローブステーション液体ヘリウムフリー低温プローブステーション

Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field

品質自動磁気測定のための精密冷凍探査ステーション工場 — 自動磁気測定のための精密冷凍探査ステーション

Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature

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MRAMテスター

品質 MRAMとスピントロニックチップテスタートライテンプATE自動テスト機器工場 — MRAMとスピントロニックチップテスタートライテンプATE自動テスト機器

MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic

品質自動 MRAM テストマグネティックチップ最終試験機高速工場 — 自動 MRAM テストマグネティックチップ最終試験機高速

Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different

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磁気プローブステーション

品質平面および垂直磁気プローブステーション 140 MT ウェーハプローバー高度なテスト用工場 — 平面および垂直磁気プローブステーション 140 MT ウェーハプローバー高度なテスト用

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

品質 140 MT ウェーファー探査ステーション 2D探査ステーションスピントロニクスとウェーファーレベル試験工場 — 140 MT ウェーファー探査ステーション 2D探査ステーションスピントロニクスとウェーファーレベル試験

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

品質ベクトル磁気プローブステーション 2Dデバイス特性評価用スケーラブルウェーハプローブステーション工場 — ベクトル磁気プローブステーション 2Dデバイス特性評価用スケーラブルウェーハプローブステーション

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

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