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Mikroskop gaya atom

Kualitas 0.04nm Mikroskop Kekuatan Atom 0.1Hz - 30Hz Mikroskop AFM Untuk Analisis Permukaan Nanoscale yang Tepat pabrik

0.04nm Mikroskop Kekuatan Atom 0.1Hz - 30Hz Mikroskop AFM Untuk Analisis Permukaan Nanoscale yang Tepat

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

0.04nm Mikroskop Kekuatan Atom 0.1Hz - 30Hz Mikroskop AFM Untuk Analisis Permukaan Nanoscale yang Tepat

Kualitas 0.1Hz - 30Hz Mikroskop Kekuatan Atom Mikroskop Probe Pemindaian Nanoscale pabrik

0.1Hz - 30Hz Mikroskop Kekuatan Atom Mikroskop Probe Pemindaian Nanoscale

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

0.1Hz - 30Hz Mikroskop Kekuatan Atom Mikroskop Probe Pemindaian Nanoscale

Kualitas Mikroskop Atomik Pindai Modulasi Gaya Ilmu Resolusi Tinggi Mikroskop 0.04 Nm pabrik

Mikroskop Atomik Pindai Modulasi Gaya Ilmu Resolusi Tinggi Mikroskop 0.04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

Mikroskop Atomik Pindai Modulasi Gaya Ilmu Resolusi Tinggi Mikroskop 0.04 Nm

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Mikroskop Kerr

Kualitas Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik pabrik

Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik

Kualitas Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses pabrik

Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses

Kualitas Low Temperature High Field Kerr Microscope Laser MOKE Mikroskop untuk Micro Region Imaging pabrik

Low Temperature High Field Kerr Microscope Laser MOKE Mikroskop untuk Micro Region Imaging

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

Low Temperature High Field Kerr Microscope Laser MOKE Mikroskop untuk Micro Region Imaging

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Magnetometer sampel bergetar

Kualitas Sistem VSM Kunci Kunci Kecepatan Tinggi Vibrating Magnetometer Untuk Pengukuran Magnetik yang Cepat dan Dapat Diandalkan pabrik

Sistem VSM Kunci Kunci Kecepatan Tinggi Vibrating Magnetometer Untuk Pengukuran Magnetik yang Cepat dan Dapat Diandalkan

Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and

Sistem VSM Kunci Kunci Kecepatan Tinggi Vibrating Magnetometer Untuk Pengukuran Magnetik yang Cepat dan Dapat Diandalkan

Kualitas Tinggi Akurasi Getaran Sampel Magnetometer Low Noise VSM Sistem Untuk Pilihan Medan Tinggi pabrik

Tinggi Akurasi Getaran Sampel Magnetometer Low Noise VSM Sistem Untuk Pilihan Medan Tinggi

Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its

Tinggi Akurasi Getaran Sampel Magnetometer Low Noise VSM Sistem Untuk Pilihan Medan Tinggi

Kualitas Magnetometer VSM Getaran Presisi Tinggi Sensitivitas Tinggi pabrik

Magnetometer VSM Getaran Presisi Tinggi Sensitivitas Tinggi

High-Precision Vibrating Sample Magnetometer Product Introduction The TIM-70 high-precision vibrating sample magnetometer, independently developed by Zhizhen Precision, measures magnetization curves, hysteresis loops, demagnetization curves, heating curves, cooling curves, and other magnetic parameters such as saturation magnetization, remanent magnetization, coercive force, maximum energy product, Curie temperature, superconducting transition temperature, Néel temperature,

Magnetometer VSM Getaran Presisi Tinggi Sensitivitas Tinggi

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Stasiun Probe Cryogenic

Kualitas Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor pabrik

Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor

Kualitas Stasiun Probe Krio Medan Vertikal Bebas Kriogen Stasiun Probe Suhu Rendah pabrik

Stasiun Probe Krio Medan Vertikal Bebas Kriogen Stasiun Probe Suhu Rendah

Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field

Stasiun Probe Krio Medan Vertikal Bebas Kriogen Stasiun Probe Suhu Rendah

Kualitas Stasiun Sonde Kriogenik Precision Stasiun Sonde Bebas Kriogen Untuk Pengukuran Magnetik Otomatis pabrik

Stasiun Sonde Kriogenik Precision Stasiun Sonde Bebas Kriogen Untuk Pengukuran Magnetik Otomatis

Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature

Stasiun Sonde Kriogenik Precision Stasiun Sonde Bebas Kriogen Untuk Pengukuran Magnetik Otomatis

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Stasiun Probe Magnetik

Kualitas Di Stasiun Probe Magnetik Bidang dan Vertikal 140 MT Wafer Prober Untuk Pengujian Lanjutan pabrik

Di Stasiun Probe Magnetik Bidang dan Vertikal 140 MT Wafer Prober Untuk Pengujian Lanjutan

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

Di Stasiun Probe Magnetik Bidang dan Vertikal 140 MT Wafer Prober Untuk Pengujian Lanjutan

Kualitas 140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing pabrik

140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing

Kualitas Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D pabrik

Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D

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