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原子力顕微鏡
高解像度原子力顕微鏡 0.04 Nm ナノスケール解析のための産業顕微鏡
High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0
高解像度原子力顕微鏡 0.04 Nm ナノスケール解析のための産業顕微鏡
多機能AFM原子間力顕微鏡 精密生物顕微鏡
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,
多機能AFM原子間力顕微鏡 精密生物顕微鏡
ウェーハレベル原子間力顕微鏡 0.1Hz - 30Hz プローブ顕微鏡
Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations
ウェーハレベル原子間力顕微鏡 0.1Hz - 30Hz プローブ顕微鏡
カー顕微鏡
高感度MOKEシステム ヒステレシスループ測定器 弱磁気と2次元材料研究
High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic
高感度MOKEシステム ヒステレシスループ測定器 弱磁気と2次元材料研究
極低温MOKEカー顕微鏡ヒステリシスループ測定装置 2次元強磁性体材料分析用
Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring
極低温MOKEカー顕微鏡ヒステリシスループ測定装置 2次元強磁性体材料分析用
クリオMOKEシステム 科学研究 磁気化イメージングのための測定器具
Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise and convenient in-plane and vertical magnetic field measurements. This instrument is an essential component of any Cryogenic Magnetic Imaging System and 2D Material Characterization System, providing researchers with valuable data for their scientific experiments. With an in-plane
クリオMOKEシステム 科学研究 磁気化イメージングのための測定器具
マグニートー光クライオスタット
精密磁気光学クライオスタット統合磁石クライオスタット フレキシブルな低温測定用
Integrated Magneto Optical Cryostat For Flexible Cryo Measurements Product Description: The Magneto Optical Cryostat is a cutting-edge device designed for advanced research in the field of magneto optical measurements. With its exceptional features and superior performance, this cryostat offers researchers a powerful tool to conduct experiments in high magnetic fields with precision and accuracy. One of the standout attributes of this cryostat is its optical windows
精密磁気光学クライオスタット統合磁石クライオスタット フレキシブルな低温測定用
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
極低温プローブステーション
閉ざされたサイクル 低温探査ステーション 汎用型真空探査ステーション
Low Temperature Probe Station For Magnetic Transport Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge solution designed for precise measurements in low-temperature environments. This Cryogen Free system offers exceptional performance in sample analysis with its advanced features and capabilities. One of the key highlights of this product is its remarkable Vibration control, ensuring Sample Stage Vibration is less than 1
閉ざされたサイクル 低温探査ステーション 汎用型真空探査ステーション
磁場冷凍探査ステーション 360度探査ステーション
Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The
磁場冷凍探査ステーション 360度探査ステーション
360度半導体プローブステーション 低温真空プローブステーション スピントロニクス用
Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature
360度半導体プローブステーション 低温真空プローブステーション スピントロニクス用
MRAMテスター
MRAMとスピントロニックチップテスター トライテンプATE自動テスト機器
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic
MRAMとスピントロニックチップテスター トライテンプATE自動テスト機器
自動 MRAM テスト マグネティックチップ 最終試験機 高速
Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different
自動 MRAM テスト マグネティックチップ 最終試験機 高速
磁気プローブステーション
拡張可能な研究開発のための精密RF探査ステーション
Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0
拡張可能な研究開発のための精密RF探査ステーション
機内磁気探査ステーション 精密装置試験のための汎用DC探査ステーション
In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One
機内磁気探査ステーション 精密装置試験のための汎用DC探査ステーション
0.05 MT 磁気探査ステーション 精密半導体探査機 スピントロニクスと半導体試験用
Magnetic Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spintronic devices. This advanced probe station offers a myriad of features and capabilities that make it an indispensable tool for researchers and engineers working in the field of spintronics. The probe station is equipped with 4 groups of DC probes, 1 group of RF
