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Atomic Force Microscope

Quality Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 Nm factory

Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 Nm

Quality High Resolution Atomic Force Microscope 0.04 Nm Industrial Microscope For Nanoscale Analysis factory

High Resolution Atomic Force Microscope 0.04 Nm Industrial Microscope For Nanoscale Analysis

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

High Resolution Atomic Force Microscope 0.04 Nm Industrial Microscope For Nanoscale Analysis

Quality Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope factory

Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope

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Kerr Microscope

Quality High Sensitivity MOKE System Hysteresis Loop Measurement Instrument For Weak Magnetism And 2D Material Study factory

High Sensitivity MOKE System Hysteresis Loop Measurement Instrument For Weak Magnetism And 2D Material Study

High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic

High Sensitivity MOKE System Hysteresis Loop Measurement Instrument For Weak Magnetism And 2D Material Study

Quality Cryogenic MOKE Kerr Microscope Hysteresis Loop Measurement Instrument For 2D Ferromagnetic Material Analysis factory

Cryogenic MOKE Kerr Microscope Hysteresis Loop Measurement Instrument For 2D Ferromagnetic Material Analysis

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring

Cryogenic MOKE Kerr Microscope Hysteresis Loop Measurement Instrument For 2D Ferromagnetic Material Analysis

Quality Cryo MOKE System Scientific Research Measurement Instruments For Magnetization Imaging factory

Cryo MOKE System Scientific Research Measurement Instruments For Magnetization Imaging

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise and convenient in-plane and vertical magnetic field measurements. This instrument is an essential component of any Cryogenic Magnetic Imaging System and 2D Material Characterization System, providing researchers with valuable data for their scientific experiments. With an in-plane

Cryo MOKE System Scientific Research Measurement Instruments For Magnetization Imaging

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Cryogenic Probe Station

Quality Closed Cycle Low Temperature Probe Station Versatile Vacuum Probe Station factory

Closed Cycle Low Temperature Probe Station Versatile Vacuum Probe Station

Low Temperature Probe Station For Magnetic Transport Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge solution designed for precise measurements in low-temperature environments. This Cryogen Free system offers exceptional performance in sample analysis with its advanced features and capabilities. One of the key highlights of this product is its remarkable Vibration control, ensuring Sample Stage Vibration is less than 1

Closed Cycle Low Temperature Probe Station Versatile Vacuum Probe Station

Quality Magnetic Field Cryogenic Probe Station 360 Degrees Probing Station factory

Magnetic Field Cryogenic Probe Station 360 Degrees Probing Station

Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The

Magnetic Field Cryogenic Probe Station 360 Degrees Probing Station

Quality 360 Degrees Semiconductor Probe Station Low Temperature Vacuum Probe Station For Spintronics factory

360 Degrees Semiconductor Probe Station Low Temperature Vacuum Probe Station For Spintronics

Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature

360 Degrees Semiconductor Probe Station Low Temperature Vacuum Probe Station For Spintronics

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Magnetic Probe Station

Quality Programmable Probe Station Precise RF Probe Station For Expandable Research And Development factory

Programmable Probe Station Precise RF Probe Station For Expandable Research And Development

Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0

Programmable Probe Station Precise RF Probe Station For Expandable Research And Development

Quality In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing factory

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

Quality 0.05 MT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing factory

0.05 MT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing

Magnetic Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spintronic devices. This advanced probe station offers a myriad of features and capabilities that make it an indispensable tool for researchers and engineers working in the field of spintronics. The probe station is equipped with 4 groups of DC probes, 1 group of RF

0.05 MT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing

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