High Scanning Force Microscope 0.15 Nm High Resolution Microscope For Wafe

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level.

One of the key features of the AFM is its versatile imaging modes, including Topography, Phase, Friction, and Lateral Force imaging. These modes allow users to capture detailed information about the sample surface, such as height variations, material contrast, frictional properties, and lateral forces. By utilizing these imaging modes, researchers can gain a comprehensive understanding of the sample's surface characteristics and behavior.

The AFM offers an impressive resolution of 0.15 nm, enabling users to visualize surface features with exceptional clarity and precision. This high resolution is crucial for conducting detailed surface analysis and obtaining accurate measurements for various applications. Whether performing roughness measurements or studying surface topography, the AFM delivers unmatched resolution for precise imaging and analysis.

In addition to its imaging capabilities, the AFM provides exceptional force resolution of 0.15 nN, allowing researchers to investigate the mechanical properties of samples with exceptional sensitivity. The precise force resolution of the AFM enables users to perform nanoindentation experiments, measure adhesion forces, and explore the elastic properties of materials at the nanoscale level. With its high force resolution, the AFM offers valuable insights into the mechanical behavior of samples.

When it comes to sample size, the AFM accommodates a wide range of specimens, supporting sizes up to 200 mm x 5200 mm. This generous sample size capacity allows users to analyze various types of samples, from small nanostructures to larger surfaces, providing flexibility and versatility for diverse research projects. Whether examining individual nanoparticles or large-scale surfaces, the AFM offers the capability to investigate samples of different sizes with ease.

The AFM offers multiple scanning modes, including Contact, Tapping, and Non-contact modes, providing users with flexibility in their imaging approach. Contact mode enables direct interaction between the AFM probe and the sample surface, offering high resolution and precise topographical imaging. Tapping mode reduces tip-sample interactions, minimizing sample damage and extending probe lifespan, ideal for delicate samples. Non-contact mode utilizes intermittent tip-sample interactions, suitable for studying soft samples and biomolecules without physical contact. With these scanning modes, researchers can choose the most suitable approach for their specific imaging requirements.

In summary, the Atomic Force Microscope (AFM) is a powerful tool for surface analysis, roughness measurement, and high-resolution imaging at the nanoscale level. With its advanced imaging modes, exceptional resolution, precise force sensitivity, versatile sample size capacity, and multiple scanning modes, the AFM empowers researchers to explore the intricate details of sample surfaces and gain valuable insights into their properties. Whether studying materials, biological samples, or nanoscale structures, the AFM provides unmatched capabilities for comprehensive surface analysis and scientific discovery.

Features:

• Product Name: Atomic Force Microscope
• Scan Range: 100 μm X 100 μm
• Resolution: 0.15 Nm
• Sample Size: Up To 200 Mm X 5200mm
• Imaging Modes: Topography, Phase, Friction, Lateral Force
• Scanning Modes: Contact, Tapping, Non-contact

Technical Parameters:

Applications:

Truth Instruments' AtomEdge Pro Atomic Force Microscope, originating from China, is a powerful tool designed for various surface analysis applications across different industries. With a scan range of 100 μm x 100 μm and imaging modes including topography, phase, friction, and lateral force, this scanning force microscope offers precise and detailed imaging capabilities.

One of the key application scenarios for the AtomEdge Pro is in the field of semiconductor research and development. The high force resolution of 0.15 NN makes it ideal for analyzing semiconductor surfaces at a nanoscale level. Researchers and engineers in the semiconductor industry can utilize this AFM to study surface properties, defects, and structures with exceptional precision.

Moreover, the AtomEdge Pro is well-suited for various surface analysis tasks in industries such as materials science, nanotechnology, and biology. Its compatibility with Windows software allows for seamless data analysis and visualization, making it a versatile instrument for research laboratories and academic institutions.

Whether it's characterizing nanostructures, measuring surface roughness, or studying biological samples, the AtomEdge Pro offers flexibility and reliability in sample analysis. The generous sample size support of up to 200 mm x 5200 mm enables users to study a wide range of samples, making it suitable for diverse research projects and industrial applications.

In conclusion, Truth Instruments' AtomEdge Pro Atomic Force Microscope is a valuable tool for surface analysis across multiple industries. Its advanced features, precise imaging capabilities, and compatibility with Windows software make it an essential instrument for researchers, scientists, and engineers involved in nanotechnology, materials science, and other fields requiring high-resolution imaging and analysis.