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Atomaire krachtmicroscoop

Kwaliteit Hoge resolutie atoomkrachtmicroscoop 0,04 Nm industriële microscoop voor nanoschaalanalyse fabriek

Hoge resolutie atoomkrachtmicroscoop 0,04 Nm industriële microscoop voor nanoschaalanalyse

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

Hoge resolutie atoomkrachtmicroscoop 0,04 Nm industriële microscoop voor nanoschaalanalyse

Kwaliteit Multi Functionele AFM Atomic Force Microscopie Precisie Biologie Microscoop fabriek

Multi Functionele AFM Atomic Force Microscopie Precisie Biologie Microscoop

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

Multi Functionele AFM Atomic Force Microscopie Precisie Biologie Microscoop

Kwaliteit Wafer Level Atomic Force Microscopen 0.1Hz - 30Hz Probes Microscoop fabriek

Wafer Level Atomic Force Microscopen 0.1Hz - 30Hz Probes Microscoop

Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations

Wafer Level Atomic Force Microscopen 0.1Hz - 30Hz Probes Microscoop

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Kerr -microscoop

Kwaliteit Hoge gevoeligheid MOKE-systeem hysteresislus meetinstrument voor zwak magnetisme en 2D-materiaalonderzoek fabriek

Hoge gevoeligheid MOKE-systeem hysteresislus meetinstrument voor zwak magnetisme en 2D-materiaalonderzoek

High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic

Hoge gevoeligheid MOKE-systeem hysteresislus meetinstrument voor zwak magnetisme en 2D-materiaalonderzoek

Kwaliteit Cryogeen MOKE Kerr Microscoop Hysteresis Loop Meetinstrument Voor 2D Ferromagnetische Materiaalanalyse fabriek

Cryogeen MOKE Kerr Microscoop Hysteresis Loop Meetinstrument Voor 2D Ferromagnetische Materiaalanalyse

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring

Cryogeen MOKE Kerr Microscoop Hysteresis Loop Meetinstrument Voor 2D Ferromagnetische Materiaalanalyse

Kwaliteit Cryo MOKE-systeem Wetenschappelijk onderzoek Meetinstrumenten voor magnetisatiebeeldvorming fabriek

Cryo MOKE-systeem Wetenschappelijk onderzoek Meetinstrumenten voor magnetisatiebeeldvorming

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise and convenient in-plane and vertical magnetic field measurements. This instrument is an essential component of any Cryogenic Magnetic Imaging System and 2D Material Characterization System, providing researchers with valuable data for their scientific experiments. With an in-plane

Cryo MOKE-systeem Wetenschappelijk onderzoek Meetinstrumenten voor magnetisatiebeeldvorming

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Cryogene sondestation

Kwaliteit Gesloten cyclus Laagtemperatuur Probe Station Versatile Vacuüm Probe Station fabriek

Gesloten cyclus Laagtemperatuur Probe Station Versatile Vacuüm Probe Station

Low Temperature Probe Station For Magnetic Transport Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge solution designed for precise measurements in low-temperature environments. This Cryogen Free system offers exceptional performance in sample analysis with its advanced features and capabilities. One of the key highlights of this product is its remarkable Vibration control, ensuring Sample Stage Vibration is less than 1

Gesloten cyclus Laagtemperatuur Probe Station Versatile Vacuüm Probe Station

Kwaliteit Magnetisch veld cryogene sonde station 360 graden proefstation fabriek

Magnetisch veld cryogene sonde station 360 graden proefstation

Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The

Magnetisch veld cryogene sonde station 360 graden proefstation

Kwaliteit 360 graden halfgeleidersonde station lage temperatuur vacuümsonde station voor spintronics fabriek

360 graden halfgeleidersonde station lage temperatuur vacuümsonde station voor spintronics

Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature

360 graden halfgeleidersonde station lage temperatuur vacuümsonde station voor spintronics

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Magnetisch sondestation

Kwaliteit Programmeerbare probeerstation fabriek

Programmeerbare probeerstation

Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0

Programmeerbare probeerstation

Kwaliteit In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing fabriek

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

Kwaliteit 0.05 MT Magnetische proefstation Precise Semiconductor Prober voor spintronics en semiconductor testing fabriek

0.05 MT Magnetische proefstation Precise Semiconductor Prober voor spintronics en semiconductor testing

Magnetic Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spintronic devices. This advanced probe station offers a myriad of features and capabilities that make it an indispensable tool for researchers and engineers working in the field of spintronics. The probe station is equipped with 4 groups of DC probes, 1 group of RF

0.05 MT Magnetische proefstation Precise Semiconductor Prober voor spintronics en semiconductor testing

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