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Tryby kontaktu/dotyku dla analizy materiałów subnanometrowych w skali nano
Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 Hz, allowing users to tailor the scanning speed according to their specific application needs. Whether conducting detailed surface analysis or rapid sample inspections, this
Mikroskop wysokiej siły skanowania 0,15 Nm Mikroskop wysokiej rozdzielczości dla fal
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
4K Cryogenic Tester z stabilnością ±1,20mK i 0-67GHz mikrofalowych dla 2-calowych próbek w stacji badawczej o niskiej temperaturze
PS-Cryo 4K Cryogenic Probe Station The PS-Cryo 4K cryogenic probe station is a state-of-the-art solution designed for precise electrical testing of samples at ultra-low temperatures ranging from 4K to 420K. This cost-effective system meets demanding requirements for researchers and engineers working with advanced materials and semiconductor devices at cryogenic temperatures. Key Features Low-vibration high-vacuum cryogenic probe station ensuring stable and precise measurement
Magnetooptyczna analiza efektu Kerra: KMPL-PM dla technologii mikromagnetycznej
Product Description: The Kerr Microscope is a highly specialized instrument designed for advanced magnetic field research and material characterization. It offers exceptional precision and stability, making it an indispensable tool for scientists and engineers working in the fields of magnetism and material science. One of the standout features of this microscope is its remarkable temperature stability, maintaining an ultra-fine control within ±50 millikelvin (MK). This
Stacja do sondowania manualnego na poziomie wafla z sondą do pomiaru pola magnetycznego w płaszczyźnie
Wafer-Level Manual In-Plane Magnetic Field Probe Station Product Introduction The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable
360 stopni półprzewodnikowa stacja sondy niskotemperaturowa próżniowa stacja sondy dla spintroniki
Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature
Wszechstronny i czuły wibracyjny magnetometr próbki do pomiaru właściwości magnetycznych o niskim poziomie szumów
High Sensitivity VSM Accurate Vibrating Sample Magnetometer Systems Product Description: Introducing the Vibrating Sample Magnetometer, a cutting-edge device designed for precise and efficient magnetic measurements. This advanced instrument is equipped with a range of features that make it an essential tool for researchers and scientists seeking accurate data on magnetic properties. The sample holder of the Vibrating Sample Magnetometer offers a remarkable ±360-degree
Mram i Spintronic Chip Tester TRI TEMP ATEMATOWANY SPRZEDAŻ TESTOWY do zautomatyzowanego testowania wsadowego
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic
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Nowości
Niedawno zespół badawczy z Centrum Spintroniki i Systemów Kwantowych w Szkole Inżynierii Materiałowej Uniwersytetu Xi'an Jiaotong opublikował...
Nowości
Niedawno zespół badawczy z Instytutu Badań nad Czystej Energii i Chemii Paliw,Szkoła Inżynierii Chemicznej Uniwersytetu Nauki i Technologii w...
Naszą misją jest oferowanie "wysokiej jakości" i "dobrej usługi" i "szybkiej dostawy", aby pomóc naszym klientom uzyskać więcej zysków.
