Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope

Name: Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope
Brand: Truth Instruments Co., Ltd.
SKU: AtomEdge Pro
Availability: InStock

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

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AFM Microscope

AFM Systems

Scanning Probe Microscope

Product Details

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Multi Functional AFM Atomic Force Microscopy

AFM Atomic Force Microscopy Precise

Precise Biology Microscope

Name: AFM Atomic Force Microscopy

Scanning Method: XYZ Three-axis Full Sample Scanning

Scanning Range: 100 μm X100 μmx 10 μm

Scanning Rate: 0.1-30 Hz

Noise Level In The XY Direction: 0.4 Nm

Noise Level In The Z Direction: 0.04 Nm

Basic Properties

Place of Origin: CHINA

Brand Name: Truth Instruments

Model Number: AtomEdge Pro

Trading Properties

Minimum Order Quantity: 1

Price: Price Negotiable | Contact us for a detailed quote

Payment Terms: T/T

Product Description

Multi-Functional Atomic Force Microscope

Product Model:

AtomEdge Pro

Product Description:

The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.

Equipment Performance:

Sample Size	25 mm
Scanning Method	XYZ three-axis full sample scanning
Scanning Range	100 μm x100 μmx 10 μm
Scanning Rate	0.1-30 Hz
Noise Level in The XY Direction	0.4 nm
Noise Level in The Z Direction	0.04 nm
Nonlinearity	0.15% in the xY direction and 1% in the Z direction
lmage Sampling Point	The maximum resolution of the scanning probe image is 4096x4096
Working Mode	Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode
Multifunctional Measurement	Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force micro-scope (PFM),magnetic force microscope (MFM), force curve