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Quality Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed factory
Quality Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed factory

Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed

Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different
Tags:

Automated Test Equipment

ATE Test Equipment

Final Tester
Product Details
Highlight:

Automatic MRAM Tester

,

MRAM Tester High Speed

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Magnetic Chip Final Test Machine
Excitation system3: The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe;
Excitation system2: The Uniformity Of The X-axis Magnetic Field Is ≤±1%@2000 Oe@Φ35 Mm Spherical Space;
Excitation system1: The Maximum Magnetic Field Intensity On The X-axis Is ±2000 Oe;
Excitation system4: The Resolution Of The Magnetic Field Monitor Is ≤10 μT
Test Ambient Temperature Module: Temperature Overshoot ≤0.5°C
Electric Displacement Stage Module: θ-axis Adjustment Range: ±180°; Rotational Accuracy ≤1°; Equipped With An Absolute Position Encoder

Basic Properties

Place of Origin: CHINA
Brand Name: Truth Instruments
Model Number: MCT 500

Trading Properties

Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
Product Description

Automatic Magnetic Chip Final Test Machine

Product Introduction

Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security.  This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different temperature conditions, ensuring chip performance and reliability across multiple extreme environments. Equipped with precision temperature sensors for high-accuracy three-temperature testing, a magnetic field control system providing in-plane and normal plane stable controllable magnetic fields, non-magnetic test seats, and thermal sinks, along with electrical source meters, it creates a testing environment for non-destructive, batch testing of magnetic and electrical properties of chips, playing an important role in magnetic chip development and production.

Equipment Performance
Indicator Category Description
Excitation System The maximum magnetic field intensity on the X-axis is ±2000 Oe;
The uniformity of the X-axis magnetic field is ≤±1%@2000 Oe@Φ35 mm spherical space;
The true value of the magnetic field under zero magnetic field is ≤0.1 Oe;
High-precision Magnetic Field Sensor The resolution of the magnetic field monitor is ≤10 μT
Electric Displacement Stage Module θ-axis adjustment range: ±180°; rotational accuracy ≤1°; equipped with an absolute position encoder
Temperature Control System The outlet temperature supports a range of -70°C to 220°C;
Test Ambient Temperature Module

The internal temperature range of the Socket is -60°C to 170°C

It is equipped with a temperature monitoring module, with a temperature accuracy of ≤0.5°C;
Temperature overshoot ≤0.5°C
Socket Test Seat The test seat can withstand temperatures ranging from -60°C to 170°C;
The material is non-magnetic
Application Cases
Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed 0
  • Power-On Response Time
Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed 1
  • Digital Output VS Magnetic Flux Density & Sampling Pulse
Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed 2
  • TMR Sensor Chip Temperature Output Characteristic Curve
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