AtomExplorer: High-Precision Scanning Probe Microscope (SPM/AFM)

Product Description:

The Basic-type Atomic Force Microscope is a cutting-edge nanoscale microscope designed to provide high-precision imaging and multifunctional measurement capabilities for a wide range of scientific and industrial applications. This advanced instrument employs an XYZ three-axis full-sample scanning method, allowing users to meticulously analyze sample surfaces with exceptional accuracy and detail. Whether you are conducting research in materials science, biology, or nanotechnology, this atomic force microscope offers the versatility and performance needed to meet your demanding requirements.

One of the standout features of this nanoscale microscope is its comprehensive suite of multifunctional measurement modes. It supports Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). This range of capabilities enables users to explore not only the topography of samples but also their electrical, piezoelectric, and magnetic properties. The inclusion of Magnetic Force Microscopy MFM is particularly valuable for researchers studying magnetic materials, thin films, and nanostructures, providing detailed insights into magnetic domains and interactions at the nanoscale.

The operating modes available on this atomic force microscope enhance its adaptability and ease of use. Users can select from Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode depending on the nature of their samples and the type of data required. Tap Mode is ideal for imaging soft or delicate samples with minimal damage, while Contact Mode offers high-resolution imaging for harder surfaces. Lift Mode facilitates non-contact measurements such as magnetic and electrostatic forces, reducing tip wear and sample disturbance. Phase Imaging Mode provides additional contrast based on material properties, enabling detailed compositional mapping.

Ensuring the longevity and reliability of the microscope’s probe, the Basic-type Atomic Force Microscope incorporates an innovative Tip Protection Technology known as Safe Needle Insertion Mode. This feature minimizes the risk of tip damage during insertion and setup, which is crucial for maintaining consistent imaging quality and reducing operational costs. The safe needle insertion process also simplifies sample preparation and microscope operation, making it accessible for both experienced users and those new to atomic force microscopy.

Image quality and resolution are critical factors in nanoscale microscopy, and this instrument excels with an impressive image sampling range from 32*32 to 4096*4096 points. This extensive range allows users to balance scanning speed and image detail according to their specific needs, from quick overview scans to ultra-high-resolution imaging. The high-density sampling capability ensures that even the smallest surface features and variations can be accurately captured and analyzed.

For researchers and professionals looking to buy an atomic force microscope that combines versatility, precision, and user-friendly features, the Basic-type Atomic Force Microscope is an excellent choice. Its robust scanning system, multifunctional measurement modes including Magnetic Force Microscopy MFM, and advanced tip protection technology collectively deliver a powerful platform for nanoscale investigation. Whether your focus is on fundamental research or applied development, this nanoscale microscope provides the essential tools to unlock new insights and drive innovation.

In summary, the Basic-type Atomic Force Microscope stands out as a reliable and multifunctional instrument equipped with XYZ three-axis full-sample scanning, a variety of operating modes, and specialized measurement capabilities such as EFM, KPFM, PFM, and MFM. Its Safe Needle Insertion Mode ensures probe protection, and the broad image sampling range guarantees detailed and accurate imaging. If you want to buy atomic force microscope technology that meets the highest standards of nanoscale analysis, this product is designed to exceed your expectations and support your research endeavors with precision and confidence.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Sub-nanometer resolution AFM for precise surface analysis
• Scanning Range: 100 μm * 100 μm * 10 μm / 30 μm * 30 μm * 5 μm
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM)
• Image Sampling Points: from 32 * 32 up to 4096 * 4096 for high-resolution imaging
• XYZ Three-Axis Full-Sample Scanning method for comprehensive surface coverage
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode
• Ideal AFM for scientific research and advanced material surface characterization

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer Basic-type Atomic Force Microscope (AFM), originating from China, is an advanced multifunctional measurement instrument designed for a wide range of scientific and industrial applications. With its versatile capabilities including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM), this AFM model offers comprehensive solutions for nanoscale surface characterization and analysis.

The AtomExplorer is particularly well-suited for research and development laboratories engaged in nano structure analysis. Its sub-nanometer resolution AFM enables researchers to visualize and measure surface topography with exceptional precision, capturing image sampling points ranging from 32*32 up to 4096*4096. This high resolution is essential for studying delicate nanomaterials, thin films, and complex molecular assemblies where detailed surface information is critical.

In addition to topographical imaging, the Electrostatic Force Microscopy (EFM) function of the AtomExplorer allows scientists to investigate electrical properties at the nanoscale, such as charge distribution and surface potential variations. This makes it an invaluable tool for materials science, semiconductor research, and nanoelectronics, where understanding electrostatic interactions is key to device performance and innovation.

The instrument’s scanning range options of 100 μm*100 μm*10 μm and 30 μm*30 μm*5 μm accommodate a variety of sample sizes and measurement needs, with a maximum sample size of Φ 25 mm. The low Z-axis noise level of 0.04 nm further enhances measurement accuracy, ensuring stable and reliable data acquisition even under challenging experimental conditions.

The AtomExplorer’s compact design and multifunctionality also make it ideal for educational institutions and quality control environments where versatility and precision are required. The price is negotiable, making it accessible to a broad spectrum of users who seek high-performance AFM technology without compromising on budget considerations.

Overall, the Truth Instruments AtomExplorer Basic-type AFM is a powerful and flexible tool for anyone involved in nano structure analysis, electrostatic force microscopy (EFM), and other advanced scanning probe techniques. It empowers users to explore and quantify nanoscale phenomena with confidence and clarity.