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Atomkraftmikroskop

Qualität Hochstabile Rasterkraftmikroskopie 0,1 Hz - 30 Hz AFM-Systeme für Materialbiologie und Elektronik-Bildgebung Fabrik

Hochstabile Rasterkraftmikroskopie 0,1 Hz - 30 Hz AFM-Systeme für Materialbiologie und Elektronik-Bildgebung

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features

Hochstabile Rasterkraftmikroskopie 0,1 Hz - 30 Hz AFM-Systeme für Materialbiologie und Elektronik-Bildgebung

Qualität High-Stability AtomEdge Pro AFM: 4096×4096 Auflösung 3D-Scannen + EFM/KPFM/PFM Fabrik

High-Stability AtomEdge Pro AFM: 4096×4096 Auflösung 3D-Scannen + EFM/KPFM/PFM

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample

High-Stability AtomEdge Pro AFM: 4096×4096 Auflösung 3D-Scannen + EFM/KPFM/PFM

Qualität AtomEdge Pro: Multi-Funktions-Rasterkraftmikroskop – 3D-Bildgebung für Materialien Fabrik

AtomEdge Pro: Multi-Funktions-Rasterkraftmikroskop – 3D-Bildgebung für Materialien

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements. These capabilities make it

AtomEdge Pro: Multi-Funktions-Rasterkraftmikroskop – 3D-Bildgebung für Materialien

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Kerr -Mikroskop

Qualität Hochtemperatur-MOKE-Mikroskop 450 nm Studienmikroskop für die Untersuchung starker Feldmagnetisierungsprozesse Fabrik

Hochtemperatur-MOKE-Mikroskop 450 nm Studienmikroskop für die Untersuchung starker Feldmagnetisierungsprozesse

High Temperature MOKE for Strong Field Magnetization Process Study Product Description: The Permanent Magnet Kerr Microscope is an advanced tool designed for studying magnetic materials with precision and accuracy. This cutting-edge microscope utilizes Permanent Magnet Materials to generate in-plane magnetic fields, providing researchers with valuable insights into the magnetic properties of their samples. One of the key features of this microscope is its water-cooled magnet,

Hochtemperatur-MOKE-Mikroskop 450 nm Studienmikroskop für die Untersuchung starker Feldmagnetisierungsprozesse

Qualität Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung Fabrik

Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Hochfeldwafermesssystem MOKE Wafer Scanner für MRAM und Magnetfilmcharakterisierung

Qualität Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle Fabrik

Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Wafer Level MOKE System 0,3 Mdeg für schnelle Hysterese Schleifen und Prozesskontrolle

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Kryogene Sondenstation

Qualität Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter Fabrik

Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

Hochpräzise Kryogene Sondenstationen Kryosondenstationen für Spintronik 2D-Materialien und Supraleiter

Qualität 4 Arme Automatische Sondenstation Präzisionsmagnetische Sondenstation mit 3T Supraleitmagneten Fabrik

4 Arme Automatische Sondenstation Präzisionsmagnetische Sondenstation mit 3T Supraleitmagneten

Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station offers exceptional temperature stability with a range from 10 K to 420 K, maintaining a remarkably low temperature variation of less than ±20 MK. Equipped with a vertical superconducti

4 Arme Automatische Sondenstation Präzisionsmagnetische Sondenstation mit 3T Supraleitmagneten

Qualität Vielseitige kryogene Probestation für supraleitende magnetische Probestation für Hall- und SOT-Tests Fabrik

Vielseitige kryogene Probestation für supraleitende magnetische Probestation für Hall- und SOT-Tests

Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe arms, this probe station can support up to 8 probe arms, providing flexibility and scalability for various testing needs. Featuring X-Y-Z probe arm stroke dimensions of 50 mm, 25

Vielseitige kryogene Probestation für supraleitende magnetische Probestation für Hall- und SOT-Tests

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Magnetsondenstation

Qualität 140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests Fabrik

140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

140 MT Wafer-Sondestationen 2D-Sondestation für Spintronik und Wafer-Level-Tests

Qualität Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung Fabrik

Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

Vector-Magnet-Probestation für skalierbare Wafer-Probestation zur 2D-Bauelementcharakterisierung

Qualität Programmierbare Sondenstation Präzise HF-Sondenstation für erweiterbare Forschung und Entwicklung Fabrik

Programmierbare Sondenstation Präzise HF-Sondenstation für erweiterbare Forschung und Entwicklung

Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0

Programmierbare Sondenstation Präzise HF-Sondenstation für erweiterbare Forschung und Entwicklung

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