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Atomic Force Microscope
Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 Nm Resolution
High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of
Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 Nm Resolution
0.15 Nm High Resolution Microscopes Customized Atomic Microscopes
Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and
0.15 Nm High Resolution Microscopes Customized Atomic Microscopes
High Scanning Force Microscope 0.15 Nm High Resolution Microscope For Wafe
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
High Scanning Force Microscope 0.15 Nm High Resolution Microscope For Wafe
Kerr Microscope
0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis
Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge scientific instrument designed for researchers and scientists working in the field of Low Temperature Magneto-Optics. This advanced system offers unparalleled capabilities for Micro-region Kerr measurement and Magnetization measurement, making it an essential tool for studying magnetic materials at the
0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis
Compact Hysteresis Loop Tracer For Fast Magnetic Film QC Testing
Compact Hysteresis Loop Tracer for Fast Magnetic Film QC Testing Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge product designed for precise and efficient remanence testing. As a compact and portable solution, this non-destructive magnetic tester offers exceptional performance in a miniature package. With a Kerr Angle Resolution of 1 Mdeg (RMS), this instrument provides highly accurate measurements for advanced research and
Compact Hysteresis Loop Tracer For Fast Magnetic Film QC Testing
Low Temp High Field Laser Kerr Microscope Micro Region Imaging Microscope
Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for
Low Temp High Field Laser Kerr Microscope Micro Region Imaging Microscope
Magneto Optical Cryostat
Precise Magneto Optical Cryostat Integrated Magnet Cryostat For Flexible Cryo Measurements
Integrated Magneto Optical Cryostat For Flexible Cryo Measurements Product Description: The Magneto Optical Cryostat is a cutting-edge device designed for advanced research in the field of magneto optical measurements. With its exceptional features and superior performance, this cryostat offers researchers a powerful tool to conduct experiments in high magnetic fields with precision and accuracy. One of the standout attributes of this cryostat is its optical windows
Precise Magneto Optical Cryostat Integrated Magnet Cryostat For Flexible Cryo Measurements
1.7 K - 350 K Magnet Optical Cryostat Superconducting MO Cryostat
Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate
1.7 K - 350 K Magnet Optical Cryostat Superconducting MO Cryostat
Cryogenic Probe Station
Automated Cryogenic Probe Station Magnetic Field Probe Station
Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and
Automated Cryogenic Probe Station Magnetic Field Probe Station
Cryogenic Vertical Superconducting Magnetic Field Probe Station
Cryogenic Vertical Superconducting Magnetic Field Probe Station Product Introduction The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field environment for 2-inch samples. It can accommodate samples for electrical transport testing of 2D materials, spintronic devices, superconducting materials, and Hall effect testing of
Cryogenic Vertical Superconducting Magnetic Field Probe Station
Highly Integrated Cryogenic Probe Station 4 K - 420 K Low Temperature Probe Station
Cryogenic Probe Station Product Introduction The PS-Cryo closed-loop 4 K cryogenic probe station uses a GM refrigeration mechanism, requiring no consumable liquid helium, providing a low-temperature environment down to 4 K. It can accommodate 2-inch samples and meets standard I-V, C-V, microwave, and optoelectronic testing needs. Highly integrated and systematized, software operation allows one-click temperature control and electrical testing, making it the most cost
Highly Integrated Cryogenic Probe Station 4 K - 420 K Low Temperature Probe Station
MRAM Tester
MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For Automated Batch Testing
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic
MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For Automated Batch Testing
Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed
Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different
Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed
Magnetic Probe Station
Wafer Level Manual Probe Station In Plane Magnetic Field Probe Station
Wafer-Level Manual In-Plane Magnetic Field Probe Station Product Introduction The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable
Wafer Level Manual Probe Station In Plane Magnetic Field Probe Station
2D In Plane Vertical Magnetic Probe Station High Precision Optical Probe Station
2D In Plane-Vertical Magnetic Probe Station Product Introduction The 2D magnetic field probe station PS2DY-MS is a high-precision device specifically developed for room-temperature variable magnetic field electrical testing environments. It supports both in-plane and vertical magnetic field directions, providing a uniform magnetic field environment. Combined with testing source meters and flexible probe configurations, it can perform non-destructive standard tests such as
2D In Plane Vertical Magnetic Probe Station High Precision Optical Probe Station
1D In Plane Semiconductor Probe Station Magnetic Field Probe Station
1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which
