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Atomic Force Microscope
Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, ...
Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
Basic-type Atomic Force Microscope
Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across ...
Basic-type Atomic Force Microscope
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ...
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Kerr Microscope
High Temperature MOKE Microscope 450Nm Study Microscope For Strong Field Magnetization Process Study
High Temperature MOKE for Strong Field Magnetization Process Study Product Description: The Permanent Magnet Kerr Microscope is an advanced tool designed for studying magnetic materials with precision and accuracy. This cutting-edge microscope utilizes Permanent Magnet Materials to generate in-plane ...
High Temperature MOKE Microscope 450Nm Study Microscope For Strong Field Magnetization Process Study
High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization
High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions ...
High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization
Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control
Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information ...
Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control
Magneto Optical Cryostat
High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO Cryo With Multi Directional Optical Access
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers ...
High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO Cryo With Multi Directional Optical Access
Fast Cooldown Magneto Optical Cryostat 1 Top Window MO Cryostat For Advanced Material Research
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy ...
Fast Cooldown Magneto Optical Cryostat 1 Top Window MO Cryostat For Advanced Material Research
Cryogenic Probe Station
High Precision Cryogenic Probe Station Cryo Probe Stations For Spintronics 2D Materials And Superconductors
Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the...
High Precision Cryogenic Probe Station Cryo Probe Stations For Spintronics 2D Materials And Superconductors
4 Arms Automatic Probe Station Precise Magnetic Probe Station With 3T Superconducting Magnet
Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station ...
4 Arms Automatic Probe Station Precise Magnetic Probe Station With 3T Superconducting Magnet
Versatile Cryogenic Probe Station Superconducting Magnetic Probe Station For Hall And SOT Testing
Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe ...
Versatile Cryogenic Probe Station Superconducting Magnetic Probe Station For Hall And SOT Testing
MRAM Tester
Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with ...
Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high ...
Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
Magnetic Probe Station
140 MT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing
2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic ...
140 MT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing
Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization
Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, ...
Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization
Programmable Probe Station Precise RF Probe Station For Expandable Research And Development
Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities ...
