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Mikroskop gaya atom

Kualitas Mikroskop atom biologis mikroskop pemindaian presisi tinggi mikroskop 0,15 nm resolusi pabrik

Mikroskop atom biologis mikroskop pemindaian presisi tinggi mikroskop 0,15 nm resolusi

High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of

Mikroskop atom biologis mikroskop pemindaian presisi tinggi mikroskop 0,15 nm resolusi

Kualitas 0.15 Nm Mikroskop Resolusi Tinggi Mikroskop Atom Disesuaikan pabrik

0.15 Nm Mikroskop Resolusi Tinggi Mikroskop Atom Disesuaikan

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

0.15 Nm Mikroskop Resolusi Tinggi Mikroskop Atom Disesuaikan

Kualitas Mikroskop kekuatan pemindaian tinggi 0,15 Nm Mikroskop resolusi tinggi untuk wafe pabrik

Mikroskop kekuatan pemindaian tinggi 0,15 Nm Mikroskop resolusi tinggi untuk wafe

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

Mikroskop kekuatan pemindaian tinggi 0,15 Nm Mikroskop resolusi tinggi untuk wafe

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Mikroskop Kerr

Kualitas Mikroskop Kerr 0.5 Mdeg Presisi Mikroskop Kriogenik Untuk Analisis Material Feromagnetik 2D pabrik

Mikroskop Kerr 0.5 Mdeg Presisi Mikroskop Kriogenik Untuk Analisis Material Feromagnetik 2D

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge scientific instrument designed for researchers and scientists working in the field of Low Temperature Magneto-Optics. This advanced system offers unparalleled capabilities for Micro-region Kerr measurement and Magnetization measurement, making it an essential tool for studying magnetic materials at the

Mikroskop Kerr 0.5 Mdeg Presisi Mikroskop Kriogenik Untuk Analisis Material Feromagnetik 2D

Kualitas Compact Hysteresis Loop Tracer Untuk Pengujian QC Film Magnetik Cepat pabrik

Compact Hysteresis Loop Tracer Untuk Pengujian QC Film Magnetik Cepat

Compact Hysteresis Loop Tracer for Fast Magnetic Film QC Testing Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge product designed for precise and efficient remanence testing. As a compact and portable solution, this non-destructive magnetic tester offers exceptional performance in a miniature package. With a Kerr Angle Resolution of 1 Mdeg (RMS), this instrument provides highly accurate measurements for advanced research and

Compact Hysteresis Loop Tracer Untuk Pengujian QC Film Magnetik Cepat

Kualitas Low Temper High Field Laser Kerr Microscope Mikroregion Mikroskop Pencitraan pabrik

Low Temper High Field Laser Kerr Microscope Mikroregion Mikroskop Pencitraan

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for

Low Temper High Field Laser Kerr Microscope Mikroregion Mikroskop Pencitraan

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Stasiun Probe Cryogenic

Kualitas Stasiun Probe Kriogenik Otomatis Stasiun Probe Medan Magnetik pabrik

Stasiun Probe Kriogenik Otomatis Stasiun Probe Medan Magnetik

Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and

Stasiun Probe Kriogenik Otomatis Stasiun Probe Medan Magnetik

Kualitas Stasiun Probe Medan Magnetik Superkonduktor Vertikal Kriogenik pabrik

Stasiun Probe Medan Magnetik Superkonduktor Vertikal Kriogenik

Cryogenic Vertical Superconducting Magnetic Field Probe Station Product Introduction The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field environment for 2-inch samples. It can accommodate samples for electrical transport testing of 2D materials, spintronic devices, superconducting materials, and Hall effect testing of

Stasiun Probe Medan Magnetik Superkonduktor Vertikal Kriogenik

Kualitas Stasiun Probe Kriogenik Terintegrasi Tinggi 4 K - 420 K Stasiun Probe Suhu Rendah pabrik

Stasiun Probe Kriogenik Terintegrasi Tinggi 4 K - 420 K Stasiun Probe Suhu Rendah

Cryogenic Probe Station Product Introduction The PS-Cryo closed-loop 4 K cryogenic probe station uses a GM refrigeration mechanism, requiring no consumable liquid helium, providing a low-temperature environment down to 4 K. It can accommodate 2-inch samples and meets standard I-V, C-V, microwave, and optoelectronic testing needs. Highly integrated and systematized, software operation allows one-click temperature control and electrical testing, making it the most cost

Stasiun Probe Kriogenik Terintegrasi Tinggi 4 K - 420 K Stasiun Probe Suhu Rendah

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Stasiun Probe Magnetik

Kualitas Stasiun Probe Manual Tingkat Wafer Medan Magnet Bidang In-Plane pabrik

Stasiun Probe Manual Tingkat Wafer Medan Magnet Bidang In-Plane

Wafer-Level Manual In-Plane Magnetic Field Probe Station Product Introduction The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable

Stasiun Probe Manual Tingkat Wafer Medan Magnet Bidang In-Plane

Kualitas 2D In Plane Vertikal Magnetic Probe Station Stasiun Probe Optik Presisi Tinggi pabrik

2D In Plane Vertikal Magnetic Probe Station Stasiun Probe Optik Presisi Tinggi

2D In Plane-Vertical Magnetic Probe Station Product Introduction The 2D magnetic field probe station PS2DY-MS is a high-precision device specifically developed for room-temperature variable magnetic field electrical testing environments. It supports both in-plane and vertical magnetic field directions, providing a uniform magnetic field environment. Combined with testing source meters and flexible probe configurations, it can perform non-destructive standard tests such as

2D In Plane Vertikal Magnetic Probe Station Stasiun Probe Optik Presisi Tinggi

Kualitas 1D In Plane Semiconductor Probe Station Magnetic Field Probe Station pabrik

1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which

1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

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