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Mikroskop gaya atom

Kualitas Mikroskop AFM Stabilitas Tinggi 0.1 Hz - 30 Hz Sistem AFM Untuk Biologi Bahan Dan Pencitraan Elektronik pabrik

Mikroskop AFM Stabilitas Tinggi 0.1 Hz - 30 Hz Sistem AFM Untuk Biologi Bahan Dan Pencitraan Elektronik

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features

Mikroskop AFM Stabilitas Tinggi 0.1 Hz - 30 Hz Sistem AFM Untuk Biologi Bahan Dan Pencitraan Elektronik

Kualitas Mikroskop Gaya Atom AtomEdge Pro dengan Stabilitas Tinggi: Pemindaian 3D Resolusi 4096×4096 + EFM/KPFM/PFM pabrik

Mikroskop Gaya Atom AtomEdge Pro dengan Stabilitas Tinggi: Pemindaian 3D Resolusi 4096×4096 + EFM/KPFM/PFM

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample

Mikroskop Gaya Atom AtomEdge Pro dengan Stabilitas Tinggi: Pemindaian 3D Resolusi 4096×4096 + EFM/KPFM/PFM

Kualitas AtomEdge Pro: Mikroskop Kekuatan Atom Multifungsi pabrik

AtomEdge Pro: Mikroskop Kekuatan Atom Multifungsi

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements. These capabilities make it

AtomEdge Pro: Mikroskop Kekuatan Atom Multifungsi

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Mikroskop Kerr

Kualitas Mikroskop MOKE Suhu Tinggi 450Nm Mikroskop Studi Untuk Studi Proses Magnetisasi Medan Kuat pabrik

Mikroskop MOKE Suhu Tinggi 450Nm Mikroskop Studi Untuk Studi Proses Magnetisasi Medan Kuat

High Temperature MOKE for Strong Field Magnetization Process Study Product Description: The Permanent Magnet Kerr Microscope is an advanced tool designed for studying magnetic materials with precision and accuracy. This cutting-edge microscope utilizes Permanent Magnet Materials to generate in-plane magnetic fields, providing researchers with valuable insights into the magnetic properties of their samples. One of the key features of this microscope is its water-cooled magnet,

Mikroskop MOKE Suhu Tinggi 450Nm Mikroskop Studi Untuk Studi Proses Magnetisasi Medan Kuat

Kualitas Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik pabrik

Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Sistem Pengukuran Wafer Medan Tinggi MOKE Wafer Scanner Untuk MRAM Dan Karakterisasi Film Magnetik

Kualitas Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses pabrik

Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Sistem MOKE Tingkat Wafer 0.3 Mdeg Untuk Loop Histeresis Cepat Dan Kontrol Proses

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Stasiun Probe Cryogenic

Kualitas Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor pabrik

Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

Stasiun Probe Cryogenic Presisi Tinggi Stasiun Probe Cryo Untuk Spintronics Bahan 2D Dan Superkonduktor

Kualitas Stasiun Probe Otomatis 4 Lengan Stasiun Probe Magnetik Presisi Dengan Magnet Superkonduktor 3T pabrik

Stasiun Probe Otomatis 4 Lengan Stasiun Probe Magnetik Presisi Dengan Magnet Superkonduktor 3T

Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station offers exceptional temperature stability with a range from 10 K to 420 K, maintaining a remarkably low temperature variation of less than ±20 MK. Equipped with a vertical superconducti

Stasiun Probe Otomatis 4 Lengan Stasiun Probe Magnetik Presisi Dengan Magnet Superkonduktor 3T

Kualitas Stasiun Probe Kriogenik Serbaguna Stasiun Probe Magnetik Superkonduktif Untuk Pengujian Hall Dan SOT pabrik

Stasiun Probe Kriogenik Serbaguna Stasiun Probe Magnetik Superkonduktif Untuk Pengujian Hall Dan SOT

Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe arms, this probe station can support up to 8 probe arms, providing flexibility and scalability for various testing needs. Featuring X-Y-Z probe arm stroke dimensions of 50 mm, 25

Stasiun Probe Kriogenik Serbaguna Stasiun Probe Magnetik Superkonduktif Untuk Pengujian Hall Dan SOT

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Stasiun Probe Magnetik

Kualitas 140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing pabrik

140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing

2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic properties of materials used in various applications. The Air Gap of the probe station is adjustable from 0-40 mm, allowing for flexibility in measuring magnetic fields at different

140 MT Wafer Probe Station 2D Probing Station untuk Spintronics dan Wafer Level Testing

Kualitas Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D pabrik

Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D

Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, this product is an indispensable asset for researchers and engineers working in various fields such as spintronics, magnetic materials, and more. One of the key highlights of this

Stasiun Probe Magnetik Vektor Stasiun Probe Wafer Skala untuk Karakterisasi Perangkat 2D

Kualitas Stasiun Probe yang dapat diprogram Stasiun Probe RF presisi untuk Penelitian dan Pengembangan yang dapat diperluas pabrik

Stasiun Probe yang dapat diprogram Stasiun Probe RF presisi untuk Penelitian dan Pengembangan yang dapat diperluas

Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0

Stasiun Probe yang dapat diprogram Stasiun Probe RF presisi untuk Penelitian dan Pengembangan yang dapat diperluas

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