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原子力顕微鏡
生物原子力顕微鏡 高精度スキャン探査機顕微鏡 0.15 Nm解像度
High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of
生物原子力顕微鏡 高精度スキャン探査機顕微鏡 0.15 Nm解像度
0.15 nm 高分解能顕微鏡 カスタマイズされた原子顕微鏡
Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and
0.15 nm 高分解能顕微鏡 カスタマイズされた原子顕微鏡
高スキャン力顕微鏡 0.15 Nm 高解像度顕微鏡
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is
高スキャン力顕微鏡 0.15 Nm 高解像度顕微鏡
カー顕微鏡
0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis
Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge scientific instrument designed for researchers and scientists working in the field of Low Temperature Magneto-Optics. This advanced system offers unparalleled capabilities for Micro-region Kerr measurement and Magnetization measurement, making it an essential tool for studying magnetic materials at the
0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis
コンパクトヒステレシスループトレーサ 急速磁性フィルムQCテスト
Compact Hysteresis Loop Tracer for Fast Magnetic Film QC Testing Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge product designed for precise and efficient remanence testing. As a compact and portable solution, this non-destructive magnetic tester offers exceptional performance in a miniature package. With a Kerr Angle Resolution of 1 Mdeg (RMS), this instrument provides highly accurate measurements for advanced research and
コンパクトヒステレシスループトレーサ 急速磁性フィルムQCテスト
低温高場レーザー・ケル顕微鏡 マイクロ領域画像顕微鏡
Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for
低温高場レーザー・ケル顕微鏡 マイクロ領域画像顕微鏡
マグニートー光クライオスタット
精密磁気光学クライオスタット統合磁石クライオスタット フレキシブルな低温測定用
Integrated Magneto Optical Cryostat For Flexible Cryo Measurements Product Description: The Magneto Optical Cryostat is a cutting-edge device designed for advanced research in the field of magneto optical measurements. With its exceptional features and superior performance, this cryostat offers researchers a powerful tool to conduct experiments in high magnetic fields with precision and accuracy. One of the standout attributes of this cryostat is its optical windows
精密磁気光学クライオスタット統合磁石クライオスタット フレキシブルな低温測定用
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
極低温プローブステーション
自動化冷凍探査ステーション 磁場探査ステーション
Cryogenic In-Plane Magnetic Field Probe Station Product Introduction The PS1DX-Cryo closed-loop cryogenic in-plane magnetic field probe station is designed for transport testing of magnetic materials and spintronic devices, making it the optimal choice for low-temperature magnetic transport measurements. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and
自動化冷凍探査ステーション 磁場探査ステーション
低温垂直超伝導磁場探査ステーション
Cryogenic Vertical Superconducting Magnetic Field Probe Station Product Introduction The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field environment for 2-inch samples. It can accommodate samples for electrical transport testing of 2D materials, spintronic devices, superconducting materials, and Hall effect testing of
低温垂直超伝導磁場探査ステーション
高度統合型冷凍探査装置 4K-420K低温探査装置
Cryogenic Probe Station Product Introduction The PS-Cryo closed-loop 4 K cryogenic probe station uses a GM refrigeration mechanism, requiring no consumable liquid helium, providing a low-temperature environment down to 4 K. It can accommodate 2-inch samples and meets standard I-V, C-V, microwave, and optoelectronic testing needs. Highly integrated and systematized, software operation allows one-click temperature control and electrical testing, making it the most cost
高度統合型冷凍探査装置 4K-420K低温探査装置
MRAMテスター
MRAMとスピントロニックチップテスター トライテンプATE自動テスト機器
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic
MRAMとスピントロニックチップテスター トライテンプATE自動テスト機器
自動 MRAM テスト マグネティックチップ 最終試験機 高速
Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different
自動 MRAM テスト マグネティックチップ 最終試験機 高速
磁気プローブステーション
円盤レベル マニュアル探査ステーション 飛行機磁場探査ステーション
Wafer-Level Manual In-Plane Magnetic Field Probe Station Product Introduction The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable
円盤レベル マニュアル探査ステーション 飛行機磁場探査ステーション
2D 面内垂直磁気プローブステーション 高精度光学プローブステーション
2D In Plane-Vertical Magnetic Probe Station Product Introduction The 2D magnetic field probe station PS2DY-MS is a high-precision device specifically developed for room-temperature variable magnetic field electrical testing environments. It supports both in-plane and vertical magnetic field directions, providing a uniform magnetic field environment. Combined with testing source meters and flexible probe configurations, it can perform non-destructive standard tests such as
2D 面内垂直磁気プローブステーション 高精度光学プローブステーション
1D 平面半導体探査ステーション 磁場探査ステーション
1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which
