High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

Product Description:

One of the key features of the MOKE Wafer Scanner is its non-destructive Hysteresis Loop Measurement capability. This enables users to analyze the magnetic properties of their samples without causing any damage, ensuring that the integrity of the materials remains intact throughout the testing process.

With automatic extraction of Hysteresis Loop Information , including key parameters such as free layer and pinned layer coercivity (Hc), exchange bias field (Hex), and magnetization (M) with Kerr angle value, the MOKE Wafer Scanner streamlines data collection and analysis, making it easier for users to derive meaningful insights from their measurements.

Furthermore, the MOKE Wafer Scanner offers rapid mapping of wafer magnetic characteristic distribution , allowing users to efficiently assess the spatial variation of magnetic properties across a sample. This global detection capability enables comprehensive analysis of the entire wafer surface, providing valuable information for optimizing production processes and ensuring consistent quality control.

Equipped with PID closed-loop feedback regulation technology, the MOKE Wafer Scanner delivers exceptional magnetic field resolution of 0.01 MT. This high level of precision ensures accurate and reliable measurements, empowering users to conduct in-depth analyses with confidence.

With an impressive uptime of 90%, the MOKE Wafer Scanner minimizes downtime and maximizes productivity, making it a dependable tool for continuous use in research and manufacturing environments.

Users can also benefit from the sample repeatability of the MOKE Wafer Scanner , which exceeds 10 μm. This level of consistency and accuracy ensures that measurements can be replicated with precision, enabling researchers to confidently validate their findings and draw meaningful conclusions from their experiments.

When it comes to magnetic field capabilities , the MOKE Wafer Scanner offers a vertical range of ±2.4 T and an in-plane range of ±1.3 T. This broad spectrum of magnetic field strengths enables users to characterize a wide variety of materials and devices, making the instrument versatile and adaptable to diverse research and production requirements.

Features:

• Product Name: Wafer-Level Hysteresis Loop Measurement Instrument
• Testing Efficiency: 12 WPH@±1.3 T /9 Sites Measurement/200 Mm Wafer
• Sample Size: Compatible With 12-inch And Below, Supports Fragment Testing
• Sample Repeatability: Better Than 10 μm
• Testing Functions:
  • Non-destructive Hysteresis Loop Measurement Of Magnetic Stacks/devices
  • Automatic Extraction Of Hysteresis Loop Information (free Layer And Pinned Layer Hc, Hex, M (Kerr Angle Value))
  • Rapid Mapping Of Wafer Magnetic Characteristic Distribution
• Magnetic Field Uniformity: Better Than ±1%@Φ1 Mm

Technical Parameters:

Applications:

Truth Instruments' Wafer-MOKE is a cutting-edge product designed for spintronics metrology, specifically for wafer-level hysteresis loop measurement. This advanced instrument, originating from China, offers precise and non-destructive testing functions for magnetic stacks and devices.

The Wafer-MOKE model is ideal for various product application occasions and scenarios due to its exceptional capabilities. One primary use case is in the field of MRAM testing, where the instrument enables automatic extraction of hysteresis loop information such as free layer and pinned layer Hc, Hex, and M (Kerr angle value).

With a sample repeatability better than 10 μm, the Wafer-MOKE ensures high accuracy in measurements, making it a reliable tool for industries requiring precise magnetic characterization. Its testing efficiency of 12 wafers per hour at ±1.3 T, covering 9 sites per measurement on a 200 mm wafer, enhances productivity significantly.

Moreover, the instrument's uptime of 90% contributes to uninterrupted testing processes, ensuring minimal downtime and increased productivity. The Wafer-MOKE's magnetic field capabilities of vertical ±2.4 T and in-plane ±1.3 T provide versatility in testing various magnetic materials and structures.

Whether in research laboratories, production facilities, or quality control departments, the Wafer-MOKE proves to be an indispensable tool for wafer magnetometer applications. Its rapid mapping of wafer magnetic characteristic distribution further enhances its utility in diverse scenarios requiring detailed magnetic analysis.