Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive examination of sample surfaces, ensuring high accuracy and repeatability in nanoscale research and industrial applications. The full-sample scanning capability enables the microscope to

High Sensitivity MOKE For Weak Magnetism And 2D Material Study Product Description: With a variable temperature range spanning from 4.2 K to 420 K, researchers have the flexibility to study a wide range of materials under different thermal conditions. This broad temperature range is ideal for investigating the properties of weak magnetic materials at low temperatures, providing valuable insights into their behavior and magnetic responses. One of the key features of this

Product Introduction Designed for in-depth research on permanent magnet materials, this advanced precision testing instrument enables high-resolution precise measurement and detailed observation of longitudinal, transverse, and vertical magneto-optical Kerr effects under stringent testing conditions (strong magnetic fields, ambient temperature, high temperatures). To ensure sample stability during testing under strong magnetic forces, it features an air-floating displacement

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

Cryogenic High-Magnetic-Field Laser Kerr Microimaging System Product Introduction Developed for the weak magnetism, small size, non-conductive nature, low coercive field, and low Curie temperature of two-dimensional ferromagnetic materials, this powerful characterization system features high magnetic detectionprecision, high-precision, micro-region spot measurement and positioning strong magnetic fields and wide temperature variation, meeting most of the magnetic characteriza

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its

Product Description: The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve analysis, making

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art instrument designed to provide unparalleled precision and versatility in surface property mapping at the nanoscale. Engineered to meet the demanding requirements of advanced research and industrial applications, this AFM offers a comprehensive suite of features that make it an indispensable tool for scientists and engineers working with semiconductors, magnetic materials, and a variety of other

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (Scm), and Magnetic Force Microscopy (MFM). Additionally, it