MFM/KPFM Modes For High-Precision Nanoscale Materials Characterization

Product Description:

The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive examination of sample surfaces, ensuring high accuracy and repeatability in nanoscale research and industrial applications. The full-sample scanning capability enables the microscope to scan across the entire sample area, providing a detailed and complete surface profile.

One of the standout features of this Atomic Force Microscope is its compatibility with samples up to 25 mm in diameter. This generous sample size accommodation makes it versatile for a wide range of scientific investigations and material analyses, from semiconductor wafers to biological specimens. Researchers and engineers can confidently study larger or irregularly shaped samples without compromising on resolution or scanning precision.

Precision and accuracy are critical in nanoscale measurements, and this AFM excels in this regard. It boasts exceptionally low nonlinearity, with only 0.02% in the XY direction and 0.08% in the Z direction. Such minimal nonlinearity ensures that the positional data collected during scanning is highly reliable, reducing distortion and enhancing the fidelity of surface topology images. This precision contributes significantly to achieving nanometer resolution, allowing users to explore surface features at an atomic or molecular scale.

The scanning angle range of 0 to 360 degrees further enhances the flexibility of this scanning force microscope. This full rotational scanning ability allows users to inspect and analyze surface features from any orientation, leading to more comprehensive data collection and better understanding of surface properties and behaviors. This capability is particularly beneficial when examining anisotropic materials or complex surface geometries.

What truly sets this Atomic Force Microscope apart is its multifunctional measurement capabilities. It supports multiple modes of operation, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Each of these modes provides unique insights into different physical properties of the sample, such as electrical, magnetic, and piezoelectric characteristics, enabling comprehensive surface characterization in a single instrument.

Additionally, the AFM offers an optional Conductive Atomic Force Microscopy (C-AFM) mode, which expands its functionality to include electrical conductivity measurements at the nanoscale. This optional mode is invaluable for researchers working on nanoelectronics, materials science, and semiconductor device development, where understanding electrical conduction pathways is essential.

Overall, this Atomic Force Microscope integrates multiple modes and advanced scanning technology to deliver nanometer resolution imaging and multifunctional surface analysis. Its XYZ three-axis full-sample scanning method ensures thorough and precise coverage of samples up to 25 mm in diameter, while its low nonlinearity and full 360-degree scanning angle guarantee high-fidelity data collection. Whether used in academic research, materials science, or industrial quality control, this scanning force microscope is a powerful and versatile tool that meets the demanding needs of nanoscale surface characterization.

By combining robust mechanical design, versatile measurement modes, and exceptional resolution, this AFM stands out as an essential instrument for anyone seeking to explore and understand the complexities of surfaces at the nanometer scale. Its multifunctional capabilities make it ideal for a wide array of applications, providing researchers and engineers with the detailed insights necessary to push the boundaries of nanotechnology and materials science.

Features:

• Product Name: Atomic Force Microscope (AFM)
• Scanning Range: 100 μm * 100 μm * 10 μm
• Image Sampling Points: 32*32 to 4096*4096
• Scanning Method: XYZ Three-Axis Full-Sample Scanning
• Scanning Angle: 0~360°
• Sample Size: Compatible with samples with a diameter of 25 mm
• Non-contact scanning mode for precise surface analysis
• Surface property mapping capabilities for detailed material characterization

Technical Parameters:

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope, originating from China, is an advanced tool designed for a wide range of scientific and industrial applications. Its versatile operating modes—including Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-Directional Scanning Mode—enable researchers to conduct precise surface analysis under various conditions. This flexibility makes the AtomEdge Pro ideal for detailed surface property mapping and high-resolution imaging.

One of the prominent application occasions for the AtomEdge Pro is in materials science laboratories where detailed topographical and mechanical property investigations are crucial. The device’s exceptional scanning angle range of 0~360° and low nonlinearity in the XY direction (0.02%) and Z direction (0.08%) ensure highly accurate and reproducible data collection. This precision is vital when examining nanoscale surface features and understanding the fundamental properties of new materials.

In semiconductor research and development, the AtomEdge Pro plays a significant role by enabling Scanning Kelvin Probe Microscopy (SKPM), which is essential for mapping electrical surface potentials non-invasively. The non-contact capability of this technique allows for sensitive detection of work function variations and charge distributions on semiconductor surfaces without damaging delicate samples. This makes the AtomEdge Pro an indispensable tool for quality control and device optimization in the electronics industry.

The compatibility with samples up to 25 mm in diameter makes the AtomEdge Pro suitable for various sample types, from thin films and coatings to biological specimens. In biotechnology and life sciences, the instrument’s high image sampling points—ranging from 32*32 up to 4096*4096—offer detailed visualization of cellular structures and biomolecular interactions, facilitating breakthroughs in medical research and pharmaceutical development.

Additionally, the AtomEdge Pro is widely utilized in surface chemistry and nanotechnology research for its ability to perform comprehensive surface property mapping. Researchers can analyze adhesion, friction, and magnetic properties at the nanoscale, generating critical insights into surface phenomena. The multi-directional scanning mode further enhances the microscope’s capability to capture complex surface geometries accurately.

Overall, the Truth Instruments AtomEdge Pro Atomic Force Microscope is a powerful and versatile instrument suited for diverse occasions and scenarios that demand precise surface characterization, non-contact imaging, and advanced scanning techniques like Scanning Kelvin Probe Microscopy. Its robust design and comprehensive feature set make it a valuable asset across scientific research, industrial quality assurance, and innovative technology development.