AtomExplorer: Precision Topography Tool For Chips & Nanomaterials

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These capabilities enable researchers and engineers to conduct a wide range of nanoscale surface analyses, making it an indispensable tool for material science, semiconductor research, and nanotechnology development.

One of the standout features of this Basic-type AFM is its ability to accommodate samples up to Φ 25 mm in size, providing ample space for a variety of specimen types. Whether working with thin films, coatings, or bulk materials, users can confidently analyze their samples without worrying about size constraints. The system’s XYZ three-axis full-sample scanning method ensures comprehensive and precise scanning across the entire sample surface, delivering accurate topographical and functional property data.

The image sampling resolution of the Basic-type Atomic Force Microscope is highly customizable, ranging from as low as 32*32 points to an impressive 4096*4096 points. This extensive range allows users to balance between scanning speed and image detail, depending on their experimental requirements. High-resolution imaging is essential for capturing minute surface features and understanding nanoscale phenomena, which is crucial in both academic research and industrial product development.

In addition to its multifunctional measurement capabilities and flexible imaging options, this AFM model incorporates advanced tip protection technology, specifically the Safe Needle Insertion Mode. This innovative feature safeguards the delicate AFM probes during engagement and scanning, significantly reducing the risk of tip damage and ensuring consistent measurement quality. The safe needle insertion mode enhances the instrument's reliability and longevity, which is particularly important for high-throughput industrial research environments.

Designed with stability and precision in mind, the Basic-type Atomic Force Microscope offers high stability AFM performance that minimizes noise and drift during measurements. This stability is critical for obtaining reproducible and accurate data, especially when conducting sensitive measurements such as Kelvin probe force microscopy or piezoelectric force microscopy. The robust construction and advanced control systems make this AFM a dependable instrument for long-term scientific investigations and industrial R&D projects.

As an AFM for scientific research, this model supports a broad spectrum of experimental needs, from fundamental surface characterization to complex functional property mapping. Researchers can explore electrical, magnetic, and piezoelectric properties at the nanoscale with ease, thanks to the integrated multifunctional measurement modes. Additionally, its user-friendly interface and versatile software tools facilitate data acquisition, analysis, and visualization, streamlining the research workflow.

In industrial R&D settings, the Basic-type Atomic Force Microscope serves as a critical microscope for quality control, materials development, and failure analysis. Its multifunctionality reduces the need for multiple separate instruments, saving both laboratory space and operational costs. The high stability and precision of this AFM make it an excellent choice for developing next-generation materials and devices where nanoscale properties directly impact product performance.

Overall, the Basic-type Atomic Force Microscope combines multifunctionality, high-resolution imaging, sample versatility, and advanced tip protection to deliver a comprehensive solution for nanoscale surface analysis. Whether used in academic laboratories or industrial research facilities, it stands out as a reliable, high stability AFM that meets the demanding requirements of modern scientific research and industrial innovation.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Image Sampling Points: 32*32 to 4096*4096
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, Phase Imaging Mode
• Multifunctional Measurements:
  • Electrostatic Force Microscope (EFM)
  • Scanning Kelvin Microscope (KPFM)
  • Piezoelectric Force Microscope (PFM)
  • Magnetic Force Microscope (MFM)
• Scanning Method: XYZ Three-Axis Full-Sample Scanning
• Scanning Range:
  • 100 μm * 100 μm * 10 μm
  • 30 μm * 30 μm * 5 μm
• Ideal for material surface characterization and surface texture analysis
• Enables high-resolution nanoscale topography imaging

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer Basic-type Atomic Force Microscope (AFM) is an advanced nanoscale microscope designed for high-precision surface texture analysis and nanoscale topography imaging. Originating from China, this versatile instrument caters to a wide range of research and industrial applications, offering multifunctional measurement capabilities including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These features make the AtomExplorer an indispensable tool for scientists and engineers working with nanoscale materials and surfaces.

One of the primary application occasions for the AtomExplorer is in materials science laboratories where detailed surface texture analysis is crucial. Researchers can utilize its high-resolution imaging to study the morphology and properties of various materials at the nanoscale, enabling breakthroughs in nanotechnology, semiconductor research, and thin-film characterization. The instrument’s sample size capacity of Φ 25 mm and scanning ranges of 100 μm * 100 μm * 10 μm or 30 μm * 30 μm * 5 μm accommodate a diverse array of samples, making it ideal for analyzing microelectronic components, polymers, and biomaterials.

In academic and industrial research settings, the AtomExplorer facilitates comprehensive nanoscale topography imaging, providing detailed 3D surface maps with image sampling points ranging from 32*32 up to 4096*4096. This capability allows for precise visualization and measurement of surface features, essential for quality control, failure analysis, and innovation in nanofabrication. Furthermore, the inclusion of tip protection technology such as the Safe Needle Insertion Mode ensures longevity and reliability during delicate scanning processes.

The multifunctional nature of the AtomExplorer enables its use in diverse scenarios including electrostatic and magnetic property measurements, making it valuable for studying electronic devices, magnetic materials, and piezoelectric components. Its user-friendly design and customizable scanning parameters make it suitable for routine laboratory use as well as advanced research projects. With price negotiable upon contact, the Truth Instruments AtomExplorer offers a cost-effective yet powerful solution for nanoscale microscopy needs, solidifying its place as a fundamental instrument for surface texture analysis and nanoscale topography imaging in various scientific and industrial domains.