Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution

Product Description:

One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures.

With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers can adjust the scan speed based on the nature of their samples and the level of detail required in their analysis.

The AFM is capable of accommodating sample sizes of up to 25 mm, providing ample space for researchers to study a wide range of materials and structures. This flexibility makes the AFM a valuable tool for various applications, including material science, biology, and chemistry.

Equipped with a piezo-driven XYZ stage, the sample stage of the AFM offers precise control and stability during imaging. The piezo technology allows for accurate positioning of the sample in the X, Y, and Z directions, enabling researchers to capture high-quality images with exceptional resolution.

Speaking of resolution, the AFM boasts an impressive resolution of 0.04nm, allowing researchers to visualize surface features with incredible detail. This high resolution is essential for studying nanoscale structures and analyzing surface properties at the atomic level.

In conclusion, the Atomic Force Microscope is a state-of-the-art tool that offers advanced capabilities for surface analysis. With its wide scanning range, adjustable scan speed, spacious sample size capacity, precise sample stage, and outstanding resolution, the AFM is a valuable instrument for researchers looking to explore the nanoworld and conduct in-depth studies across various scientific disciplines.

Features:

• Product Name: Atomic Force Microscope
• Scan Speed: 0.1Hz-30Hz
• Sample Stage: Piezo-driven XYZ Stage
• Sample Size: Up To 25 Mm
• Scanning Range: 100 μm X 100 μm X 10 μm
• Resolution: 0.04nm

Technical Parameters:

Applications:

Truth Instruments Atomic Force Microscope, model AtomEdge Pro, is a cutting-edge scientific instrument originating from China. With a remarkable resolution of 0.04nm, this AFM is designed to cater to a wide range of research and industrial applications.

One of the standout features of the AtomEdge Pro is its versatility in imaging modes, including topography, phase, friction, lateral force, magnetic force, and electrostatic force imaging. This multi-mode measurement capability allows researchers and engineers to gather comprehensive data about the surface properties of various materials at the nanoscale level.

Thanks to its impressive scan speed range of 0.1Hz to 30Hz, the Truth Instruments AFM enables rapid and efficient scanning of samples. Whether it's for academic research, quality control in manufacturing, or materials analysis, this scanning probe microscope offers high-speed imaging without compromising on data accuracy.

The sample stage of the AtomEdge Pro is equipped with a piezo-driven XYZ stage, providing precise control over sample positioning and movement. This feature is particularly useful for conducting experiments that require precise manipulation and scanning of samples up to 25mm in size.

Researchers across various fields, including materials science, nanotechnology, biology, and surface physics, can benefit from the capabilities of the Truth Instruments Atomic Force Microscope. Whether studying biological samples, analyzing thin films, investigating surface properties, or conducting nanomechanical experiments, the AtomEdge Pro offers a reliable and versatile solution for advanced imaging and characterization.