100μm×100μm 3D Scanning For Nanoscale Materials Science Research

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and industrial applications, particularly in fields such as semiconductors, materials science, and nanotechnology. With its exceptional capability for multi-mode measurement, the AFM offers unparalleled versatility and accuracy, enabling researchers to explore surface properties with atomic resolution.

One of the standout features of this Atomic Force Microscope is its impressive scanning range of 100 μm * 100 μm * 10 μm, which allows it to accommodate a wide variety of samples. The system is compatible with samples up to a diameter of 25 mm, making it suitable for analyzing a broad spectrum of materials and devices. Whether you are investigating semiconductor wafers or novel nanomaterials, this AFM provides the flexibility needed to handle diverse sample sizes efficiently.

Precision in positioning and movement is critical in atomic force microscopy, and this instrument excels in that regard. It employs XYZ three-axis full-sample scanning, ensuring comprehensive coverage and accuracy during measurements. The nonlinearity specifications of the system are exceptionally low, with only 0.02% in the XY direction and 0.08% in the Z direction. These precise control parameters guarantee minimal distortion and high fidelity in imaging, which is essential for achieving reliable atomic resolution results.

The AFM supports multiple operating modes, each tailored to specific measurement needs. These include Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-Directional Scanning Mode. The availability of these modes enables detailed surface characterization under various conditions and interactions. For instance, Contact Mode is ideal for measuring topography with high sensitivity, while Tap Mode reduces damage to soft samples by intermittently contacting the surface. Phase Imaging Mode allows for contrast based on material properties, and Lift Mode is useful for magnetic or electric force microscopy. Multi-Directional Scanning Mode further enhances the instrument's capability by enabling scanning from different angles, providing comprehensive data about the sample's surface characteristics.

Multi-mode measurement capability is a significant advantage of this Atomic Force Microscope. It empowers researchers to obtain a wealth of information from a single instrument, including topographical, mechanical, electrical, and magnetic properties. This versatility makes the AFM invaluable in semiconductor research, where understanding nanoscale surface features and material properties can directly impact device performance and manufacturing processes.

By delivering atomic resolution imaging, this microscope pushes the boundaries of what can be observed and measured. It allows scientists to visualize individual atoms and molecular structures, facilitating groundbreaking discoveries in nanotechnology and materials science. The high-resolution data acquired through this AFM contribute to advancements in developing smaller, faster, and more efficient semiconductor devices, among other applications.

In summary, the Atomic Force Microscope is a powerful and flexible tool that combines a broad scanning range, precise XYZ three-axis full-sample scanning, and low nonlinearity to deliver outstanding performance. Its multi-mode measurement capabilities and compatibility with samples up to 25 mm in diameter make it an essential instrument for semiconductor research and other nanotechnology fields. With atomic resolution imaging and multiple operating modes, this AFM stands out as a vital resource for scientists and engineers striving to explore and manipulate the nanoscale world with unprecedented precision.

Features:

• Product Name: Atomic Force Microscope
• Z-Axis Noise Level: 0.04 Nm for precise nanoscale measurements
• Scanning Rate: Adjustable from 0.1 Hz to 30 Hz to suit various analysis needs
• Image Sampling Points: Supports resolution from 32*32 up to 4096*4096 for detailed imaging
• Multifunctional Measurements including:
  • Electrostatic Force Microscope (EFM)
  • Scanning Kelvin Microscope (KPFM) enabling advanced Scanning Kelvin Probe Microscopy
  • Piezoelectric Force Microscope (PFM)
  • Scanning Capacitive Atomic Force Microscope (SCM)
  • Magnetic Force Microscope (MFM)
  • Optional Conductive Atomic Force Microscope (C-AFM) for nanoscale electrical measurement
• Operating Modes: Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-Directional Scanning Mode
• Ideal for Nanoscale Analysis in various scientific and industrial applications

Technical Parameters:

This Atomic Force Microscope is designed for Nanoscale Analysis and Nanoscale electrical measurement, offering Multi-Mode Measurement capabilities to meet diverse research and industrial needs.

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope (AFM), originating from China, is a cutting-edge All-in-One AFM designed to deliver unparalleled performance in nanoscale surface characterization. Its versatility and precision make it ideal for a wide range of product application occasions and scenarios, especially where detailed topography imaging is essential.

In research and development laboratories, the AtomEdge Pro serves as a vital tool for materials science, enabling scientists to analyze surface structures with exceptional resolution. The device’s advanced XYZ three-axis full-sample scanning method allows comprehensive topographical mapping across a scanning range of 100 μm * 100 μm * 10 μm, accommodating sample sizes up to 25 mm in diameter. This capability supports in-depth studies of thin films, nanostructures, and biomaterials, providing critical insights into surface morphology and mechanical properties.

Industrial quality control and semiconductor manufacturing also benefit greatly from the AtomEdge Pro’s capabilities. Its high image sampling points range, from 32*32 up to 4096*4096, ensures detailed and accurate surface topography imaging, which is essential for detecting nanoscale defects and ensuring product reliability. The low Z-axis noise level of 0.04 nm further enhances measurement precision, catering to the stringent standards required in these high-tech industries.

Moreover, the All-in-One AFM design of the AtomEdge Pro simplifies operation and integration into existing workflows, making it accessible for both expert users and those new to AFM technology. Educational institutions leverage this feature for training and research, providing students and researchers with hands-on experience in nanoscale imaging and analysis.

In summary, the Truth Instruments AtomEdge Pro Atomic Force Microscope is perfectly suited for diverse application occasions, including advanced scientific research, industrial inspection, semiconductor analysis, and educational purposes. Its comprehensive scanning capabilities, compatibility with a variety of sample sizes, and exceptional imaging resolution establish it as a premier All-in-One AFM solution for detailed topography imaging and nanoscale surface analysis.