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29

제품 "

scanning probe microscope

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  • 고정밀 나노 스케일 재료 특성 분석을 위한 저소음 Z축

    Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...
  • 서브 나노미터 물질 나노 스케일 분석을 위한 접촉/타프 모드

    Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 ...
  • 고정밀 나노 스케일 재료 특성화를 위한 MFM/KPFM 모드

    Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...
  • 과학 연구 및 산업 응용 분야에서 정밀 표면 분석 및 나노미터 규모 이미지 촬영을위한 AFM

    Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, ...
  • 신뢰할 수 있는 표면 질감 분석: AtomExplorer Basic 타입 AFM

    Product Description: The Basic-type Atomic Force Microscope (AFM) is an advanced piece of laboratory AFM equipment designed to deliver precise and reliable surface characterization across a wide range of materials. Engineered with high stability AFM technology, this instrument offers exceptional ...
  • AtomExplorer AFM으로 마스터하는 나노 스케일 표면 특성 분석

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization...
  • 과학 연구를 위한 MFM/EFM 모드를 갖춘 고안정성 AFM

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ...
  • AtomExplorer: 칩 및 나노물질 정밀 지형 분석 도구

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic ...
  • 아토믹스플로러 AFM: 재료 분석을 위한 통합 MFM, EFM 및 KFM

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ...