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  • 高精度ナノスケール材料特性評価用低ノイズZ軸

    Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...
  • サブナノメートル材料のナノスケール分析のためのコンタクト/タップモード

    Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 ...
  • 高精度ナノスケール材料の特徴付けのためのMFM/KPFMモード

    Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...
  • 精密表面分析とナノメートルスケールイメージングのためのAFM - 科学研究および産業用途

    Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, ...
  • 信頼性の高い表面質感分析:AtomExplorer 基本型AFM

    Product Description: The Basic-type Atomic Force Microscope (AFM) is an advanced piece of laboratory AFM equipment designed to deliver precise and reliable surface characterization across a wide range of materials. Engineered with high stability AFM technology, this instrument offers exceptional ...
  • 原子探査機AFMでマスターナノスケール表面特性

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization...
  • 科学研究用高安定性AFM(MFM/EFMモード搭載)

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ...
  • AtomExplorer: チップとナノ材料のための精密トポグラフィーツール

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic ...
  • AtomExplorer AFM: 材料分析用統合 MFM、EFM & KFM

    Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ...
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