Thành lập
29
sản phẩm dành cho "scanning probe microscope
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Trục Z tiếng ồn thấp cho đặc điểm vật liệu nano quy mô chính xác cao
Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ... -
Phương thức tiếp xúc / chạm cho các vật liệu dưới nanomet Phân tích quy mô nano
Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 ... -
Chế độ MFM/KPFM để xác định đặc tính vật liệu có kích thước nano có độ chính xác cao
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ... -
AFM để Phân tích Bề mặt Chính xác và Chụp ảnh Cấp độ Nanomet trong Nghiên cứu Khoa học và Ứng dụng Công nghiệp
Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, ... -
Phân tích kết cấu bề mặt đáng tin cậy: AtomExplorer AFM loại cơ bản
Product Description: The Basic-type Atomic Force Microscope (AFM) is an advanced piece of laboratory AFM equipment designed to deliver precise and reliable surface characterization across a wide range of materials. Engineered with high stability AFM technology, this instrument offers exceptional ... -
Chủ Đạo Đặc Trưng Bề Mặt Cấp Nano Với Kính Hiển Vi Lực Nguyên Tử AtomExplorer
Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization... -
AFM ổn định cao với chế độ MFM/EFM cho nghiên cứu khoa học
Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ... -
AtomExplorer: Công cụ Khảo sát Địa hình Chính xác cho Chip & Vật liệu Nano
Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic ... -
AtomExplorer AFM: MFM tích hợp, EFM & KFM cho phân tích vật liệu
Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ...