Microscope à force atomique

Imagerie 3D à l'échelle nanométrique pour la recherche sur les semi-conducteurs et les matériaux avancés

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy ...

Axe Z à faible bruit pour la caractérisation de matériaux à l'échelle nanométrique de haute précision

Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...

Modes MFM/KPFM pour la caractérisation de matériaux nanométriques de haute précision

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...

0,1 Hz - 30 Hz Microscope à force atomique 0,04 nm Microscope de haute précision avec modes multiples

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 nm, this microscope offers ...

Microscopie de la force atomique potentielle à l'échelle nanométrique Microscopes industriels réglables Haute résolution

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small ...

Microscope AFM à haute stabilité 0,1 Hz - 30 Hz Systèmes AFM pour les matériaux Biologie et électronique d'imagerie

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological ...

Automatisation de l'affichage 3D à haute stabilité AtomEdge Pro: 4096×4096 Scanner 3D à résolution + EFM/KPFM/PFM

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensa...

Scanner 3D flexible pour les applications électroniques, biomatériaux et de recherche de précision

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art instrument designed to provide unparalleled precision and versatility in surface property mapping at the nanoscale. Engineered to meet the demanding requirements of advanced research and industrial applications, this AFM ...

Mesure Multifonctionnelle (MFM/EFM) pour des Études Scientifiques Ciblées

Product Description: The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including ...

« ‹ 1 2 3 4 5 › »